电力电子电路近场耦合问题及解决方案  

Near Field Coupling Problems in Power Electronics Circuits and Solutions

作　　者：阿西夫·伊姆兰·埃蒙 吴宇轩 罗昉 Asif Imran Emon;Wu Yuxuan;Luo Fang

机构地区：[1]纽约州立大学石溪分校

出　　处：《安全与电磁兼容》2021年第4期9-16,共8页Safety & EMC

基　　金：美国自然科学基金职业发展奖(1846917)。

摘　　要：宽禁带(WBG)器件与传统的硅基器件相比具有优越的材料性能,在器件开关性能方面具有更大的优势,可以实现更高的开关速度、更低的开关损耗,从而提升电力电子模块的整体效率。但快速开关的瞬态过程也带来了许多问题,其中之一就是电磁干扰噪声的增加。在传导型电磁干扰上,为实现电力电子模块的可靠运行,已有许多针对WBG器件的相关研究,包括开关瞬态机理、噪声源及传播路径的建模、噪声抑制和电磁兼容滤波器设计等。而要设计出可靠的、且有高开关速度和高容量的电力电子系统,还需要解决电磁辐射干扰的问题。文章综述了电力电子系统中电磁辐射干扰的研究成果,其内容涵盖了WBG器件的电磁干扰源及噪声传播路径的建模、电磁干扰导致的可靠性问题分析,以及减小近场耦合的解决方案及设计原则。Wide bandgap(WBG)devices usually offer more benefit in terms of switching performance due to their superior material properties compared to their Si counterparts.Increased switching speed offers lower switching loss and improve the overall efficiency.However,fast switching transient poses many challenges one of which is increased Electromagnetic Interference(EMI)noises.Many works have been reported analyzing the switching transient mechanism of WBG devices,source of EMI noises,their propagation path and filter design to effectively contain the noise for reliable operation focusing mostly on conducted EMI.The other type of EMI noise,which is radiated in nature,needs to be addressed with same importance to successfully design reliable system in high speed,high density power electronics system.This article provides a literature review on EMI research especially on radiated EMI in power electronics systems,including discussions for modeling of radiated EMI emission source from WBG devices and noise propagation path,system reliability issues caused by radiated EMI,and noise mitigation solutions and system design guidelines.

关 键 词：电力电子电路 电磁干扰 近场耦合 

分 类 号：TM46[电气工程—电器]