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作 者:TONG Fei ZHU Zhi-Chao LIU Bo YI Ya-Sha GU Mu CHEN Hong 仝飞;朱智超;刘波;易亚沙;顾牡;陈鸿(Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology,School of Physics Science and Engineering,Tongji University,Shanghai 200092;City University of New York,SI/GC,New York,New York 10016,USA)
机构地区:[1]Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology,School of Physics Science and Engineering,Tongji University,Shanghai 200092 [2]City University of New York,SI/GC,New York,New York 10016,USA
出 处:《Chinese Physics Letters》2013年第2期214-216,共3页中国物理快报(英文版)
基 金:Supported by the National Natural Science Foundation of China under Grant Nos 11179019,11044011and 91022002;Innovation Program of Shanghai Municipal Education Commission under Grant No 11ZZ29;Shanghai Municipal Science and Technology Commission under Grant No 11ZR1440500;the Fundamental Research Funds for the Central Universities.
摘 要:We investigate the emission properties of CuI film scintillators and the effect of distributed Bragg reflectors.The free-exciton emission and the donor-acceptor pair emission from the CuI thin film with the peak wavelengths of 410 nm and 420 nm are observed.However,for the two emission bands,the distributed Bragg reflector reflection results in different enhancements,which is interpreted by the varying transmittance with wavelength.Angle-dependence of emission profile is decided by the transmittance and DBR reflection,which may be useful in scintillation detection applications.
分 类 号:TN2[电子电信—物理电子学]
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