一种温控型双脉冲测试平台的设计与应用  

Design and Application of a Temperature-Controllable Platform for Double Pulse Test

作　　者：王爱玲[1] WANG Ailing(Jining Vocational Technology College,Jining 272037,China)

机构地区：[1]济宁职业技术学院,山东济宁272037

出　　处：《通信电源技术》2021年第8期16-18,共3页Telecom Power Technology

摘　　要：双脉冲测试是一种广泛应用于绝缘栅双极型晶体管(Insulated Gate Bipolar Transistor,IGBT)驱动设计及开关特性分析的测试方法。但是已有的研究报道一般只关注该方法的原理、设计与实现。为此,考虑了温度对IGBT工作特性的影响,提出了一种温控型双脉冲测试平台的设计方案,包括负载电感设计、温控调节器选型以及加热板设计等。最后搭建了一个测试平台,实验结果验证了所提出方案的有效性。Double pulse test is a kind of testing method which is widely used in the drive design and the analysis of switching characteristics of Insulated Gate Bipolar Transistor(IGBT).However,the existing research is commonly focusing on the theory,design and implementation.Therefore,our work consider the effect of temperature on the switching performance,and propose a scheme of temperature-controllable platform,including the design of load inductance,selection of temperature regulator,and design of heating board,etc.Finally,we built a testing platform and the effectiveness of our proposal was verified by our experimental results.

关 键 词：温控型 双脉冲测试 绝缘栅双极型晶体管 

分 类 号：TN3[电子电信—物理电子学]