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作 者:刘杰莉 付文哲 赵广兴 张磊 李朝阳 王晓占 LIU Jie-li;FU Wen-zhe;ZHAO Guang-xing;ZHANG Lei;LI Zhao-yang;WANG Xiao-zhan(Xingtai Xinxiang Metallic Materials Technology Co.,Ltd.,Xingtai 054001,China)
机构地区:[1]邢台新翔金属材料科技股份有限公司,河北邢台054001
出 处:《材料保护》2021年第8期168-171,176,共5页Materials Protection
摘 要:为了研究磷化膜表面缺陷组织——白斑的形成机理,采用同一母材批号、牌号为SCM435的精线盘条在相同锌系磷化生产工艺(酸洗→高压水冲洗→水洗→磷化→中和→皂化)下,制备含白斑缺陷的磷化膜和正常磷化膜,并提取相同工艺下产生的磷化渣组织。采用体式显微镜、扫描电子显微镜(SEM)观察白斑、正常磷化膜以及磷化渣的形貌,用X射线光电子能谱(XPS)分析白斑、正常磷化膜和磷化渣的化学成分差异。结果表明:含白斑的磷化膜中仍能模糊地看出与正常磷化膜相似的形态和走向,但是其主干组织过于粗大,枝干组织不明显,相对杂乱;磷化膜表面白斑缺陷组织不是由磷化渣沉积而成,白斑组织具有正常磷化膜组织形态和走向的粗大化结晶组织,且组织中含有Fe_(2)O_(3)和较多的亚铁盐。In order to study the formation mechanism of white spot surface defect structure of phosphating film on the surface of phosphating film,the fine wire rods with the same parent material batch number and the same brand name SCM435 were used in the same zinc phosphating production process:pickling→high-pressure water washing→water washing→phosphating→neutralization→saponification,to prepare the phosphating film with white spot defects and normal phosphating film,and the phosphating slag structure deposited under the same process was taken.Stereomicroscope and scanning electron microscope(SEM)were used to observe the morphology of white spot defects,normal phosphating film and phosphating slag structure,and X-ray photoelectron spectroscopy(XPS)was used to analysis the difference in chemical composition of white spot defects,normal phosphating film and phosphating slag.Result showed that the it could still vaguely be seen that the shape and trend of the phosphating film with white spot defects were similar to the normal phosphating film,but its trunk structure was too coarse,the branch tissue was not obvious and relatively disordered.The white spot defects structure on the surface of the phosphating film was not deposited by phosphating slag.The white spots structure had coarse crystalline structure of normal phosphating film structure morphology and trend,and the structure contained Fe_(2)O_(3) and more ferrous salt.
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