Determination of damaged wheat kernels with hyperspectral imaging analysis  

作　　者：Yuanyuan Shao Chong Gao Guantao Xuan Xuemei Gao Youqing Chen Zhichao Hu 

机构地区：[1]College of Mechanical and Electrical Engineering,Shandong Intelligent Engineering Laboratory of Agricultural Equipment,Shandong Agricultural University,Taian 271018,Shandong,China [2]Nanjing Institute of Agricultural Mechanization,Ministry of Agriculture and Rural Affairs,Nanjing 210014,China [3]College of Agriculture,Food&Natural Resources,University of Missouri,Columbia,Missouri 65203,USA

出　　处：《International Journal of Agricultural and Biological Engineering》2020年第5期194-198,共5页国际农业与生物工程学报（英文）

基　　金：This work was supported by the National Natural Science Foundation of China(Grant No.31671632;No.31701325);Green Farming and Mechanical Innovation Team of Fruit Harvesting under Soil.

摘　　要：Hyperspectral imaging was applied to classify the damaged wheat kernels and healthy kernels.The spectral information was extracted from damaged wheat kernels and healthy kernels samples.The effective wavelengths were obtained from spectral of 865-1711 nm by X-loadings of principal component analysis(PCA)and successive projection algorithm(SPA)method,respectively.Partial least square method(PLS)and least square-support vector machine(LS-SVM)were then used to build classification models on full spectral data and effective wavelengths dataset,respectively.The results showed that the classification accuracy of every LS-SVM model was the best,being 100%.While the accuracy of the PLS model was slightly lower,still over 97%.The confusion matrix showed that several damaged wheat kernels samples were misclassified as healthy samples,while all healthy samples were correctly classified.The overall results indicated that hyperspectral imaging could be used for discriminating the damaged wheat kernels and could provide a reference for detecting other grain kernels grading degrees.Further,this study can provide a research basis for the development of online or portable detectors on grain damaged kernels recognition,which will be beneficial for grain grading or post-harvest quality processing of other grains.

关 键 词：hyperspectral image damaged wheat kernels DETERMINATION PCA SPA LS-SVM 

分 类 号：O17[理学—数学]