基于加速应力试验的钽电容性能退化分析与建模研究  

Performance degradation analysis and modeling of tantalum capacitor based on accelerated stress test

作　　者：赵靖英[1,2] 张珂[1,2] 刘建猛 Zhao Jingying;Zhang Ke;Liu Jianmeng(State Key Laboratory of Reliability and Intelligence of Electrical Equipment,Hebei University of Technology,Tianjin 300130,China;Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province,Hebei University of Technology,Tianjin 300130,China;State Grid Beijing Fangshan Power Supply Company,Beijing 100000,China)

机构地区：[1]河北工业大学省部共建电工装备可靠性与智能化国家重点实验室,天津300130 [2]河北工业大学河北省电磁场与电器可靠性重点实验室,天津300130 [3]国网北京房山供电公司,北京100000

出　　处：《仪器仪表学报》2021年第7期177-188,共12页Chinese Journal of Scientific Instrument

基　　金：国家自然科学基金(51777057);国家自然科学基金(51377044);河北省自然科学基金(E2019202481)项目资助。

摘　　要：针对以3,4-乙烯二氧噻吩(PEDOT)导电聚合物的固体钽电容,本文以温度和湿度为加速试验应力,采用变间隔测量法搭建4种应力85℃/85%RH、95℃/70%RH、95℃/85%RH、110℃/85%RH水平下的钽电容恒定应力加速退化试验平台,获取性能退化参量电容量和损耗因数的退化数据。针对在温湿度加速应力下钽电容退化参数的非单一变化趋势,利用有序聚类算法进行退化区间划分;基于误差函数斜率的变化率确定最佳分类数,获得钽电容的稳定退化区间;基于数据重构和维纳过程对电容量和损耗因数进行拟合,拟合精度分别达到97%和95%,验证维纳过程建模的有效性;结合Copula函数建立基于随机效应维纳过程的钽电容二元加速退化模型,进行钽电容可靠性评估,推导正常应力水平下产品寿命,符合寿命12~15年的规定。结果表明二元加速退化模型能够进行钽电容的退化性能分析和寿命预测。For solid tantalum capacitors with 3,4-ethylenedioxythiophene(PEDOT)conductive polymer,temperature and humidity are used as accelerated test stresses in this paper.Variable interval measurement method is used to build a constant stress accelerated degradation test platform for tantalum capacitors under four stress levels,which are 85℃/85%RH、95℃/70%RH、95℃/85%RH、110℃/85%RH.Degradation data of the performance degradation parameters capacitance and loss factor are obtained.Aiming at the non-single change trend of the degradation parameters of tantalum capacitor under accelerated stress of temperature and humidity,ordered clustering algorithm is used to divide the degradation interval.Optimal classification number is determined by the change rate of error function slope,and the stable degradation interval of tantalum capacitor is obtained.Based on data reconstruction and Wiener process,the capacitance and the dissipation factor are fitted and the fitting accuracy reaches 97% and 95%,respectively.As a result,the effectiveness of Wiener process model is verified.Combined with Copula function,a binary accelerated degradation model of tantalum capacitor based on random effect Wiener process is established.Reliability evaluation method is researched and the product life under normal stress level which meets the product life requirement of 12~15 years is deduced.Results show that the binary accelerated degradation model can finish degradation performance analysis and life prediction of tantalum capacitor.

关 键 词：钽电容 加速应力试验 有序聚类 WIENER过程 COPULA函数 

分 类 号：TH183.3[机械工程—机械制造及自动化]