支持掉电数据随机化的FLASH仿真器设计  

Design of FLASH Model Supports the Data Randomized of Power-Down During the HVP

作　　者：赵满怀 张春花 ZHAO Man-huai;ZHANG Chun-hua(CEC Huada Electronic Design Co.,Ltd,Beijing Key Laboratory of RFID Chip Test Technology)

机构地区：[1]北京中电华大电子设计有限责任公司射频识别芯片检测技术北京市重点实验室

出　　处：《中国集成电路》2021年第10期22-26,共5页China lntegrated Circuit

摘　　要：本文提出了一种支持掉电数据随机化的FLASH仿真器设计,通过增加高压期间接口掉电检测、擦写数据随机化等功能,实现了FLASH在高压期间接口掉电写入随机数据的功能。本设计支持FLASH擦、写、读基本操作,满足FLASH擦写后的三种数据情况的软件测试需求。本设计支持芯片的软硬件协同开发,方便程序调试和接口掉电功能测试,提高了软件开发和测试效率。This paper introduces a design method of FLASH model that supports the data randomized of power-down during the high voltage period(HVP).By adding interface check and data random during erasing or programing phase,it is contented process of the FLASH read,erase,program,and also contented the FLASH three status data after erasing or programing.This design provides the efficiency of software and hardware collaborative development,has been applied in the software debug and the interface power-down test,and improves the efficiency of software development and testing.

关 键 词：高压期间 接口掉电 数据随机化 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]