太阳黑子数对电离层总电子含量的影响  

Influence of sunspot number on ionospheric TEC

作　　者：朱云聪 周柯东 赵庆鑫 钟慧鑫 张亭 ZHU Yuncong;ZHOU Kedong;ZHAO Qingxin;ZHONG Huixin;ZHANG Ting(School of Architectural Engineering,Shandong University of Technology,Zibo,Shandong 255000,China;Shandong Provincial Institute of Land Surveying and Mapping,Jinan 250102,China)

机构地区：[1]山东理工大学建筑工程学院,山东淄博255000 [2]山东省国土测绘院,济南250102

出　　处：《测绘科学》2021年第9期49-54,75,共7页Science of Surveying and Mapping

基　　金：大地测量与地球动力学国家重点实验室开放基金资助项目。

摘　　要：针对太阳活动影响电离层变化的问题,该文利用2000年到2020年太阳黑子数和IGS组织提供的全球电离层总电子含量(TEC)格网数据,借助数理统计、相关系数及时间序列等方法,研究了太阳黑子数与电离层TEC之间的关系。实验结果表明:(1)两者之间的相关性具有分段变化的性质,分段变化由太阳黑子数的临界点L决定,因此确定了太阳黑子数与TEC日均值相关性的分段函数,并给出了太阳黑子数临界点L;(2)太阳黑子数的变化会引起电离层TEC值的变化,而这个变化具有1~3 d的滞后性,其中电离层TEC日均值滞后于太阳黑子数2 d最为明显;(3)太阳黑子数和电离层TEC值具有明显的相关性,但太阳黑子数与电离层TEC值之间年相关性强弱不均。Aiming at the problem of solar activity affecting ionospheric changes,this article used the number of sunspots from 2000 to 2020 and the global ionospheric total electron content(TEC)grid data provided by the IGS organization,with the help of mathematical statistics,correlation coefficients,and time series methods,Studied the relationship between the number of sunspots and the ionospheric TEC.The experimental results showed that:(1)The correlation between the two had the property of piecewise variation,and the piecewise variation was determined by the critical point L of the number of sunspots,so the piecewise function of the correlation between the number of sunspots and the daily mean value of TEC was determined,and the critical point L of the number of sunspots was given.(2)The variation of the number of sunspots would cause the variation of the ionospheric TEC value,which had a lag of 1 to 3 days,and the daily mean value of the ionospheric TEC lags behind the number of sunspots 2 days most obviously.(3)There was an obvious correlation between the number of sunspots and the ionospheric TEC,but the annual correlation between the number of sunspots and the ionospheric TEC was not strong or weak.

关 键 词：太阳黑子数 CODE TEC TEC日均值 临界点 

分 类 号：P228[天文地球—大地测量学与测量工程]