多铁性BiFeO_(3)薄膜中复杂畴组态的亚埃尺度研究  

Study of complex domain configuration in multiferroic BiFeO_(3) thin film

作　　者：石彤彤 耿皖荣 朱银莲 唐云龙 宫风辉 陈雨亭 刘嘉琦 马秀良[1,4] SHI Tong-tong;GENG Wan-rong;ZHU Yin-lian;TANG Yun-long;GONG Feng-hui;CHEN Yu-ting;LIU Jia-qi;MA Xiu-liang(Shenyang National Laboratory for Materials Science,Institute of Metal Research,Chinese Academy of Sciences,Shenyang Liaoning 110016;School of Materials Science and Engineering,University of Science and Technology of China,Shenyang Liaoning 110016;Songshan Lake Materials Laboratory,Dongguan Guangdong 523808;State Key Lab of Advanced Processing and Recycling on Non-ferrous Metals,Lanzhou University of Technology,Lanzhou Gansu 730050,China)

机构地区：[1]中国科学院金属研究所沈阳材料科学国家研究中心,辽宁沈阳110016 [2]中国科学技术大学材料科学与工程学院,辽宁沈阳110016 [3]松山湖材料实验室,广东东莞523808 [4]兰州理工大学有色金属先进加工与循环国家重点实验室,甘肃兰州730050

出　　处：《电子显微学报》2021年第5期522-528,共7页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.51971223,No.51922100)。

摘　　要：本文利用透射电子显微镜对外延生长的BiFeO_(3)/DyScO_(3)[110]O薄膜中复杂畴组态进行了细致的研究。衬度分析表明薄膜中存在由锯齿状畴和界面纳米畴组成的复杂畴。像差校正电镜研究发现锯齿状畴的顶点通常位于180°畴壁、109°畴壁和71°畴壁的交点,纳米畴位于薄膜与衬底的界面位置。且界面处存在纳米尺寸缺陷,分析得出这种界面纳米缺陷促进了纳米畴的形成,进而诱导复杂畴结构的形成。The complex domain configuration in epitaxial BFO thin film grown on/DSO(110)O substrates has been investigated by transmission electron microscopy.Contrast analyses show that complex domains compose of zigzag domains and interfacial nanodomains in the thin film.An aberration-correction electron microscopy study showed that the vertices of the serrated domains are usually located at the intersection of the 180°,109°,and 71°domains,and the nanodomains are located at the interface between the thin film and the substrate.Moreover,nano-sized defects were found at the interface,and it was found that the interface nano-defects promoted the formation of nanodomains.The formation of complex domain structures was also induced in this paper.

关 键 词：铁酸铋薄膜 畴组态 铁电畴壁 缺陷 透射电子显微镜 

分 类 号：TB383[一般工业技术—材料科学与工程] O77[理学—晶体学]