基于扫描电镜原位拉伸EBSD-DIC微观变形研究方法  

Micro-deformation research method of in-situ tensile EBSD-DIC based on SEM

作　　者：高文杰 桑利军 王晋[2] 张跃飞[1] 张泽[2] GAO Wen-jie;SANG Li-jun;WANG Jin;ZHANG Yue-fei;ZHANG Ze(l.Institute of Microstructure and Property of Advanced Materials,Beijing University of Technology,Beijing 100124;Center of Electron Microscope,State Key Laboradory of Silicon Materials,School of Materials Science and Engineering,Zhejiang University,Hangzhou Zhejiang 310027,China)

机构地区：[1]北京工业大学固体微结构与性能研究所,北京100124 [2]浙江大学电子显微镜中心,硅材料国家重点实验室,材料科学与工程学院,浙江杭州310027

出　　处：《电子显微学报》2021年第5期589-594,共6页Journal of Chinese Electron Microscopy Society

基　　金：国家科技重大专项经费资助(J2019-Ⅲ-0008-0051);国家自然科学基金基础科学中心项目(No.51988101)。

摘　　要：本文提出了一种基于扫描电镜(SEM)的原位拉伸EBSD-DIC微观变形研究方法,对Inconel 718合金在原位拉伸变形过程中局部应变分布演化与形貌、晶粒取向、晶界演化的之间的关联性进行了研究,并对比了DIC方法与KAM方法研究局部应变分布的异同。实验结果表明:Inconel 718合金在原位拉伸过程中以滑移及晶粒转动等方式协同变形,在晶界及部分晶粒内出现了应变集中。晶界处应变演化规律DIC方法与KAM方法的结果保持一致,而晶粒内部的应变分布更适合使用DIC方法表征。In this paper,a micro-deformation research method of in-situ tensile EBSD-DIC based on SEM is proposed,and the correlation between strain distribution evolution and morphological change,grain orientation change and grain boundary evolution of Inconel 718 alloy during in-situ tensile deformation is studied,and the similarities and differences between the DIC method and KAM method are compared.The results show that the Inconel 718 alloy is deformed by sliding and grain rotation in the process of tensile deformation,and the strain concentration appears at the grain boundary and in some grains.At the grain boundary the result of the KAM method is consistent with DIC method,and the strain distribution inside the crystal is more suitable for the use of DIC method.

关 键 词：原位拉伸 微观变形 EBSD DIC 

分 类 号：O76[理学—晶体学] TG111[金属学及工艺—物理冶金]