原子力显微镜在高分子表征中的应用  

Application of Atomic Force Microscopy in Polymer Characterization

作　　者：王冰花[1] 陈金龙 张彬[1] Wang;Jin-long Chen;Bin Zhang(School of Materials Science&Engineering,Zhengzhou University,Zhengzhou 450001)

机构地区：[1]郑州大学材料科学与工程学院,郑州450001

出　　处：《高分子学报》2021年第10期1406-1420,共15页Acta Polymerica Sinica

基　　金：国家自然科学基金(基金号51973202,51773182,52003247)资助项目。

摘　　要：原子力显微镜(AFM)是一种在纳米尺度表征材料表面形貌结构、性能和演变的有效工具,在高分子科学领域具有广泛应用.AFM不仅可以表征高分子从单分子链到聚集态结构的形貌与性能,也能够原位研究外场作用下高分子结晶与熔融、嵌段高分子自组装和共混高分子相分离等过程,进一步采用基于扫描探针刻蚀技术的机械刻蚀、电致刻蚀和热致刻蚀等还可以构筑高分子功能化微图案.这里首先简述AFM的工作原理及常用成像模式,进一步介绍AFM在高分子表征中的样品制备、扫描参数优化和图像数据处理的一些要点.最后结合国内外相关研究进展,简单综述了AFM在高分子聚集态结构形貌与相转变表征、高分子纳米尺度性能表征和高分子纳米加工3个方面的典型应用.Atomic force microscopy(AFM)is a powerful tool for characterizing the nanoscale surface topography,structures,properties and dynamic process of materials,which has been widely used in polymer science.With the advances of multiparametric and multifunctional characterization,AFM not only can probe the surface topography and physicochemical properties of polymers from the structure of individual molecules to aggregation structures,but also enables the in situ study of crystallization and melting of polymers,self-assembly of block copolymers and phase separation of blend polymers by real-time imaging.Furthermore,the scanning probe lithography(SPL)(e.g.mechanical-SPL,bias induced SPL,thermal-SPL)provides an attractive nanofabrication method on polymer surface and demonstrates potential applications.Here,we present a survey on the working principle and classic imaging modes of AFM,with an emphasis on the preparation of polymer samples,the optimization of scan parameters,image processing and data analysis.And we summarize recent research progress on the applications of AFM in polymer science,mainly focusing on imaging the surface topography,quantitatively mapping the physicochemical properties,the dynamic evolution of phase transition,and nanofabrication method based on SPL.We hope this review would be conducive to understanding the AFM techniques and promote further applications of AFM in polymer characterization.

关 键 词：原子力显微镜 高分子表征 聚集态结构 微观性能 扫描探针刻蚀加工 

分 类 号：TQ317.2[化学工程—高聚物工业]