Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis  

作　　者：Wei-Tao Yang Xue-Cheng Du Yong-Hong Li Chao-Hui He Gang Guo Shu-Ting Shi Li Cai Sarah Azimi Corrado De Sio Luca Sterpone 

机构地区：[1]School of Nuclear Science and Technology,Xi’an Jiaotong University,Xi’an 710049,China [2]National Innovation Center of Radiation Application,China Institute of Atomic Energy,Beijing 102413,China [3]Dipartimento Di Automatica E Informatica,Politecnico di Torino,10129 Torino,Italy [4]School of Nuclear Science and Technology,University of South China,Hengyang 421001,China

出　　处：《Nuclear Science and Techniques》2021年第10期156-165,共10页核技术（英文）

基　　金：This work was supported by the National Natural Science Foundation of China(Nos.11575138,11835006,11690040,11690043,and 11705216);the Innovation Center of Radiation Application(No.KFZC2019050321);the China Scholarships Council program(No.201906280343).

摘　　要：The propagation of single-event effects(SEEs)on a Xilinx Zynq-7000 system on chip(SoC)was inves-tigated using heavy-ion microbeam radiation.The irradia-tion results reveal several functional blocks’sensitivity locations and cross sections,for instance,the arithmetic logic unit,register,D-cache,and peripheral,while irradi-ating the on-chip memory(OCM)region.Moreover,event tree analysis was executed based on the obtained microbeam irradiation results.This study quantitatively assesses the probabilities of SEE propagation from the OCM to other blocks in the SoC.

关 键 词：System on chip Single-event effect Heavy-ion microbeam Event tree analysis 

分 类 号：TN47[电子电信—微电子学与固体电子学]