聚焦型折射率显微成像系统空间分辨率的影响因素及改进方法  

Influencing Factors and Improved Methods of Spatial Resolution of Focused Refractive Index Microscopy Imaging System

作　　者：杨艺哲 刘中法 方宇 吴晓静[2] 杨勇[1] 朱思伟[2] Yang Yizhe;Liu Zhongfa;Fang Yu;Wu Xiaojing;Yang Yong;Zhu Siwei(Institute of Modern Optics,Nankai University,Tianjin 300071,China;Tianjin Uniori Medical Centre,Tianjiii 300121,China)

机构地区：[1]南开大学现代光学研究所,天津300071 [2]天津市人民医院,天津300121

出　　处：《光学学报》2021年第17期135-144,共10页Acta Optica Sinica

基　　金：国家自然科学基金(12074203,11774256)。

摘　　要：为了提高成像系统的空间分辨率,分析聚焦型折射率显微成像系统中聚焦光斑尺寸与包络形状对空间分辨率的影响机制,提出一种通过数值去卷积算法改善成像空间分辨率的方法。首先分析聚焦广义柱矢量光束的空间场分布,接着对比该光束与理想细光束在折射率显微成像过程中对空间分辨率的影响差异。通过测量折射率与形状已知的PS(Polystyrene)小球,获得该实验条件下系统的点扩展函数。采用去卷积算法对其他样品图像进行重构,获得更加接近真实情况的实验结果。结果表明,该方法对提高该系统的成像质量与空间分辨率有着显著的效果。In order to improve the spatial resolution of the imaging system,the influence mechanisms of the focal spot size and envelope shape in the focused refractive index microscopy imaging system on the spatial resolution are analyzed,and a method for improving the imaging spatial resolution through a numerical deconvolution algorithm is proposed.First,the spatial field distribution of the focused generalized cylindrical vector beam is analyzed,and then the difference between the influence of this beam and the ideal slim beam on the spatial resolution during the refractive index microscopic imaging process is compared.By measuring PS(Polystyrene)spheres with known refractive index and shape,the point spread function of the system under the experimental conditions is obtained.The deconvolution algorithm is used to reconstruct other sample images to obtain experimental results closer to the real situation.The results show that this method has a significant effect on improving the imaging quality and spatial resolution of the system.

关 键 词：物理光学 石墨烯 折射率成像 光束分析 空间分辨率 

分 类 号：O436[机械工程—光学工程]