光纤微弯损耗的新测试方法仿真算法及验证  

Simulation Algorithms and Verification for New Test Methods of Microbending Loss in Optical Fibers

作　　者：薛梦驰 左琼华[3] Xue Mengchi;Zuo Qionghua(Chengdu Tairui Telecommunication Equipmejit Test Co.,Ltd.,Chengdu,Sichuan 610062,China;The Fifth Research bistitute of Telecommunication Science and Technology,Chengdu,Sichuaii 610062,China;National Transmission Network Product and System Security Quality Inspection and Testing Center,Cheyigdu,Sichuan 610062,China)

机构地区：[1]成都泰瑞通信设备检测有限公司,四川成都610062 [2]电信科学技术第五研究所,四川成都610062 [3]国家传送网产品与系统安全质量检验检测中心,四川成都610062

出　　处：《光学学报》2021年第18期20-26,共7页Acta Optica Sinica

基　　金：中国通信标准化协会团体标准项目(2020-CCSA-23)。

摘　　要：为清晰了解光纤微弯损耗的产生机理,并对其进行有效地估算和测试,对产生光纤微弯损耗的两种机理——纯弯曲致微弯及耦合致微弯进行了分析,简述了与此最相关且最有效的理论公式,指出了影响微弯损耗最重要的因素;提出金属网覆盖光纤盘法及双槽平板法;基于截向应变及纯弯曲理论,针对两种机理,分别建立了两种对应的仿真算法,通过对被测光纤在测试平台中产生的微小畸变和弯曲进行分解和仿真,实现了对两类微弯损耗的估算;建立测试平台并进行实际测试,结果表明,所提仿真算法的计算值与实测结果的一致性较为满意,所提测试方法可以用于制订标准并加以推广。To make clear the generation mechanism of microbending loss in optical fibers and effectively estimate and test microbending loss,this paper analyzed two mechanisms,i.e.,microbending caused by pure bending and that by coupling,briefly described the most relevant and effective theoretical formulas,and pointed out the most important factors affecting the microbending loss.Two methods to test microbending loss were proposed for the first time,respectively using an optical fiber reel covered by metal mesh and a double-slot plate.In light of the transverse strain and pure bending theory,two corresponding simulation algorithms were established respectively.Depending on the decomposition and simulation of microdistortion and microbending of the tested optical fibers in test platforms,the microbending loss was estimated.The established platforms were then used for testing.The verification results show that the calculated values of the proposed simulation algorithms are in good agreement with the measured results,and the proposed test methods can be employed for standard formulation and extended.

关 键 词：光纤光学 测试方法 仿真算法 微弯 弯曲损耗 敏感性 

分 类 号：TN253[电子电信—物理电子学]