基于漫反射光偏振特性的三维成像技术研究进展  

Advances in Diffused Polarization-Based Three-Dimensional Imaging Technology

作　　者：刘飞 闫明宇 李轩 韩平丽 刘严严[4] 邵晓鹏 Liu Fei;Yan Mingyu;Li Xuan;Han Pingli;Liu Yanyan;Shao Xiaopeng(School of Physics and Optoelectronic Engineering,Xidian University,Xi'an,Shaanxi 710071,China;Xi’an Key Laboratory of Computational Imaging,Xi'an,Shaanxi 710071,China;Key Laboratory of Optical Engineering,Chinese Academy of Sciences,Chengdu,Sichuan 610000,China;Science and Technology on Electro-Optical Information Security Control Laboratory,Tianjin 300308,China)

机构地区：[1]西安电子科技大学物理与光电工程学院,陕西西安710071 [2]西安市计算成像重点实验室,陕西西安710071 [3]中国科学院光束控制重点实验室,四川成都610000 [4]光电信息控制和安全技术重点实验室,天津300308

出　　处：《激光与光电子学进展》2021年第18期312-325,共14页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(62075175,62005203);中央高校基本科研业务费(XJS190502,XJS200505,RW200145);中国科学院光束控制重点实验室基金项目(QC20191097);光电信息控制和安全技术重点实验室基金项目(61421070203)。

摘　　要：在光电探测领域,偏振特性能够有效反演物体表面材料特性、物体表面三维形貌信息,因此备受关注。而利用漫反射偏振特性求解三维形貌时,物体表面法线的天顶角信息与偏振度一一对应,使得其在复杂光照场景中应用广泛。结合物体表面反射光波的类型及其偏振特性模型,系统分析了漫反射偏振三维成像技术的原理,并对漫反射偏振三维成像技术现有的研究进展以及对该技术现有基础与未来发展方向进行了详细阐述。Polarization property has attracted much attention because it can be used for the inversion of the material characteristics and the three-dimensional morphology information of the object surface in the field of photoelectric detection.However,when using the diffuse reflection polarization property to solve the three-dimensional morphology,the zenith angle information of the surface normal and the degree of polarization have the one-to-one correspondence,which makes it widely applicable in complex lighting scenes.In this paper,we systematically analyzed the principle of diffuse reflection polarization three-dimensional imaging technology via the type of reflected light wave and its polarization characteristic model.Meanwhile,we described in detail about the current research progress of diffuse reflection polarization three-dimensional imaging technology,the exisiting foundation of the technology,and the future development direction.

关 键 词：成像系统 偏振特性 漫反射 三维成像 法线多值性校正 

分 类 号：O436.3[机械工程—光学工程]