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作 者:徐霜艳 张进[1,2] 万杰 夏豪杰 纪峰[1,2] XU Shuang-yan;ZHANG Jin;WAN Jie;XIA Hao-jie;JI Feng(School of Instrument Science and Opto-electronics Engineering,Hefei University of Technology,Hefei 230009,China;Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,Hefei 230009,China)
机构地区:[1]合肥工业大学仪器科学与光电工程学院,安徽合肥230009 [2]测量理论与精密仪器安徽省重点实验室,安徽合肥230009
出 处:《光学精密工程》2021年第8期1804-1810,共7页Optics and Precision Engineering
基 金:国家自然科学基金面上项目(No.51975179)。
摘 要:对于高温下的视觉测量,如何降低高温构件本身发出的辐射以及热气流对图像质量的影响,在航空航天和汽车制造等领域具有重要意义。针对高温下复杂的光学成像环境,本文提出了一种基于单像素成像技术的高温构件图像采集方法,建立了高温构件单像素成像系统,分析了傅里叶单像素成像的工作原理及重建算法,根据高温物体的热辐射特性分析了其对单像素成像的影响及成像光谱范围。最后,对高温环境中的单像素成像进行了验证实验。实验结果表明:仅用30%的采样数据就可以对高温下的目标构件成像,且忽略了高温物体自身辐射光的强干扰。与传统CCD/CMOS的成像及边缘检测对比实验表明,本文的方法获取的图像特征更为清晰。该研究为单像素成像在高温构件工业领域的应用提供了一个潜在的发展方向。For visual measurement at high temperature,it is challenging to reduce the radiation emitted by high-temperature components and the influence of hot gas flow on image quality,which has a significant impact in fields such as aerospace or automotive manufacturing. Owing to the complicated optical imaging environment at high temperature,in this paper,a new method of image acquisition for high-temperature components based on Fourier single-pixel imaging is proposed,and a single pixel imaging system for hightemperature components is established. First,the working principle and reconstruction algorithm of Fourier single-pixel imaging are analyzed. Then,according to the thermal radiation characteristics of the hightemperature object,the influence of the object on the single-pixel imaging and the imaging spectral range are analyzed. Finally,a verification experiment is carried out for single-pixel imaging in a high-temperature environment. Experimental results indicate that only 30% of the sampled data can be used to image the target at high temperature,and the strong interference of the radiated light of the object itself is ignored. The experimental results show that the image features obtained by the proposed method are clearer than those obtained via traditional CCD/CMOS imaging and edge detection. This study provides a potential development direction for the application of single-pixel imaging in the industrial field of high-temperature components.
分 类 号:TN27[电子电信—物理电子学] TP391[自动化与计算机技术—计算机应用技术]
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