基于wiener过程的唇形密封圈剩余寿命预测模型研究  

Residual Life Prediction Model of Lip Seal Ring Based on Wiener Process

作　　者：陈启航 孙灏 孙成 CHEN Qi-hang;SUN Hao;SUN Cheng(The 723 Institute of CSIC,Yangzhou 225001)

机构地区：[1]中国船舶重工集团公司第七二三研究所,扬州225001

出　　处：《环境技术》2021年第5期80-84,共5页Environmental Technology

摘　　要：唇形密封圈作为一种常见的动密封件,考虑其尺寸多样、工况复杂、失效形式多等特点,基于失效物理建立的剩余寿命预测模型会存在较大误差。本文依靠对密封圈的关键性能参数进行在线监测采集,利用退化数据建立基于wiener过程的唇形密封圈剩余寿命预测模型。并采用贝叶斯方法,根据不同的性能参数数据量分别对其剩余寿命进行可靠性评估,最后,利用全寿命周期采集得到的试验数据对模型的仿真精度进行验证。Lip seal ring is a common dynamic seal.Considering its various sizes,complex working conditions,and various multiple failure modes,the residual life prediction model based on failure physics may be some errors.In this paper,the key performance parameters of seals are monitored and collected online,and the parameters are used to establish the residual life prediction model of seal ring based on wiener process.Besides,according to different data volume,the residual life of seal ring is evaluated by Bayesian method.The accuracy of the model is verified by experimental data obtained from the whole life cycle collection of simulation model test.

关 键 词：WIENER过程 唇形密封圈 寿命预测 可靠性 

分 类 号：TN306[电子电信—物理电子学]