微波开关可靠性评价技术研究  

Research on Reliability Evaluation Technology of Microwave Switch

作　　者：冉红雷 韦婷 张魁[1] 彭浩[1] 黄杰[1] RAN Hong-lei;WEI Ting;ZHANG Kui;PENG Hao;HUANG Jie(The 13th Research Institute of CETC,Shijiazhuang 050051;The 58th Research Institute of CETC,Wuxi 214000)

机构地区：[1]中国电子科技集团公司第十三研究所,石家庄050051 [2]中国电子科技集团公司第五十八研究所,无锡214000

出　　处：《环境技术》2021年第5期111-115,共5页Environmental Technology

摘　　要：以某GaN基HEMT型微波开关为例研究可靠性评价技术,结合其材料结构特性、失效模式、应用模式和可靠性指标设计可靠性评价试验。首先设计包含温度循环试验和恒定加速度试验的材料工艺验证试验;其次基于微波开关的实际应用模式设计射频考机试验,验证微波开关应用条件下的可靠性和稳定性;最后设计基于温度的加速寿命试验,验证微波开关长期工作可靠性。A GaN-based HEMT microwave switch was taken as an example to study the reliability evaluation technology,and a reliability evaluation test was designed based on its material structure characteristics,failure mode,application mode and reliability indicators.Firstly,temperature cycling test and constant acceleration test was designed to verify the stability of material and process.Secondly,based on the actual application mode of the microwave switch,RF burn-in was designed to verify the reliability and stability of the microwave switch under application conditions.Finally,an accelerated life test based on temperature was designed to verify the long-term reliability of the microwave switch.

关 键 词：微波开关 可靠性评价 加速寿命试验 射频考机 

分 类 号：TN60[电子电信—电路与系统]