半导电缓冲阻水带与铝护套接触形成白斑的实验  被引量:1

Experiment of White Spot Formed by Contact between Semi-conductive Buffer Water and Aluminum Jacket

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作  者:卞佳音 单鲁平 徐研 刘晓东 刘培镇 唐文川 何亚忠 Bian Jiayin;Shan Luping;Xu Yan;Liu Xiaodong;Liu Peizhen;Tang Wenchuan;He Yazhong(Guangzhou Power Supply Bureau,Guangdong Power Grid Co.,Ltd.,Guangzhou 510620,China;Guangzhou Nanyang Cable Group Co.,Ltd.,Guangzhou 511356,China)

机构地区:[1]广东电网有限责任公司广州供电局,广州510620 [2]广州南洋电缆集团有限公司,广州511356

出  处:《机电工程技术》2021年第10期230-233,共4页Mechanical & Electrical Engineering Technology

基  金:广东电网有限责任公司广州供电局项目(编号:GZHKJXM20180104)。

摘  要:近年来高压、超高压XLPE绝缘电力电缆中出现的半导电缓冲层烧蚀现象严重影响电力电缆的可靠性和安全性。为理解缓冲阻水层与铝护套烧蚀机理,研究缓冲阻水层结构缺陷产生的原因,分别对工作在干燥和不同含水率条件下的电缆铝护套与半导电缓冲阻水带进行了模拟实验。实验结果显示,电流集中某个点流过半导电缓冲阻水带与铝护套之间接触的位置,将引起电流烧蚀,缓冲阻水带会形成若干个烧蚀洞眼;往半导电缓冲阻水带分别加入5 mL、10 mL纯净水,半导电缓冲阻水带材受潮后与铝护套接触都有白斑生成,生成速率基本一致;同样是在相同含水率的条件下,在半导电缓冲阻水带与铝护套之间施加100 mA的交流电流,会加速白斑的生成,几分钟内就能快速生成白斑。白斑呈现高电阻状态。In recent years,the semi-conductive buffer layer ablation in HV and UHV XLPE insulated power cables has seriously affected the reliability and safety of power cables.In order to understand the ablative mechanism of the buffer water resistance layer and the aluminum sheath,and to study the causes of the structural defects of the buffer water resistance layer,simulation experiments were conducted on the aluminum sheath and the semi-conductive buffer water resistance belt working under dry and different water content conditions.The experimental results show that the current concentration at a certain point flows through the contact position between the semi-conductive buffer water and the aluminum sheath,which will cause the current ablation,and the buffer water will form several ablative holes.Adding 5 mL and 10 mL pure water to the semi-conductive buffer water resistance belt,white spots are generated when the semi-conductive buffer water resistance strip is affected with moisture and contact with the aluminum sheath,and the generation rate is basically the same.Under the same water content,100 mA AC current is applied between the semi-conductive buffer water and aluminum jacket,which will accelerate the formation of white spots.White spots can be quickly generated within a few minutes.White spot presents high resistance state.

关 键 词:半导电缓冲阻水带 含水率 白斑生成实验 白斑成份 交联聚乙烯绝缘电力电缆 

分 类 号:TM206[一般工业技术—材料科学与工程]

 

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