硫碲替换硫系玻璃中硬度和抗碎裂性能演化的结构起源探索  

Revealing the Structural Origin of the Dependence of Hardness and Crack Resistance on the Substitution of S by Te in a Chalcogenide Glass

作　　者：杨亦博 高运周 陶海征[1] YANG Yi-bo;GAO Yun-zhou;TAO Hai-zheng(State Key Laboratory of Silicate Materials for Architectures,Wuhan University of Technology,Wuhan 430070,China;Sichuan Shenguang Quartz Science and Technology Co Ltd,Jiangyou 621700,China)

机构地区：[1]武汉理工大学硅酸盐建筑材料国家重点实验室,武汉430070 [2]四川神光石英科技有限公司,江油621700

出　　处：《武汉理工大学学报》2021年第1期1-6,共6页Journal of Wuhan University of Technology

基　　金：国家自然科学基金(51772223)。

摘　　要：基于Te部分替换S,采用熔融-淬冷法制备了组分为Ga8Sb32S60-xTex(x=0,2.5,5,7.5,10)的系列硫系玻璃样品。利用傅里叶红外光谱仪、显微维氏硬度仪,对样品的透过性能、硬度和抗碎裂性进行了详细表征。结果表明:Te替换S进入玻璃体系,玻璃的中红外透过截止波长仅发生微小红移;不含Te时玻璃硬度最大(214.4kgf/mm^(2)),随着Te的引入,玻璃维氏硬度逐渐下降,该现象可基于拓扑限制理论进行合理解释;不含Te时玻璃表现出最大的抗碎裂性(28.7g),随Te的逐步引入,玻璃的抗碎裂性呈现非线性非指数变化,该现象归因于自由体积、平均键能以及微不均匀区等影响抗碎裂性因素的竞争和协同作用。A series of Ga8 Sb32 S60-xTex(x = 0,2.5,5,7.5,10)glasses were prepared by melt quenching method.The transmittance spectrum was measured by a Fourier Transform Infrared Spectrometer.The Vickers hardness(Hv)and crack resistance(CR)were characterized by using a micro-hardness Vickers tester.The results show that Ga8 Sb32 S60-xTex glasses have the excellent mid-infrared transmittance.With the substitution of Te for S,however,the long-wavelength cutoff edge only exhibits red shift slightly.The maximum values of Hvfor these glasses is 214.4 kgf/mm^(2) when x=0.With the increase of Te content,the Hvvalue decreases gradually.The linear decrease of hardness can be explained reasonably based on the topological constraint theory.The maximum value of CRfor these glasses is 28.7 g when x=0.With the increase of Te content,the CRvalue exhibits a non-linear and non-exponential change.The evolution of CR with the increase of xcould be attributed to the competition and synergism among free volume,average bond energy and micro-inhomogeneous region in the present chalcogenide glassy system.

关 键 词：硫系玻璃 硬度 抗碎裂性 拓扑限制理论 

分 类 号：TB484[一般工业技术—包装工程]