高速数电芯片参数测试方案优化研究  

Research on parameter test scheme optimization of high speed digital and electrical chip

作　　者：余蓓敏[1] YU Bei-min(School of Electronic Engineering,Anhui Vocational and Technical College of Electronic Information,Anhui Bengbu 233000,China)

机构地区：[1]安徽电子信息职业技术学院电子工程学院,安徽蚌埠233000

出　　处：《齐齐哈尔大学学报（自然科学版）》2022年第2期27-31,共5页Journal of Qiqihar University(Natural Science Edition)

基　　金：安徽电子信息职业技术学院校级科研项目——基于LK8810系列平台数字芯片参数测试方案优化研究(2021AHDZZK01);安徽电子信息职业技术学院校级教科研项目(2021AHDZZJ06)。

摘　　要：为了解决高速数电芯片测试速度慢、测试精度低的问题,提出一种利用LK88系列测试平台对集成电路高速数电芯片参数进行有效测试的方法。该测试方案通过对高速数电芯片SN74HC138的测试,可以实现快速筛出失效芯片、进行功能验证、对高速数电芯片的直流参数进行精准测试,最后通过上位机直观显示出来。测试过程易于操作、增强了可读性。与芯片Spec参数标准对比分析后可以得出测试精准性也有效提高。因为缩短了整体测试时长,并且精度提高,对于提升集成电路产业链经济效益方面具有积极影响。In order to solve the problems of slow test speed and low test accuracy of high-speed digital chips,an effective test method for the key parameters of integrated circuit high-speed digital chips using LK88 series test platform is proposed.By testing the high-speed digital chip SN74HC138,the test scheme can quickly screen out the failed chip,verify the function,accurately test the DC parameters of the high-speed digital chip,and finally display it intuitively through the host computer.The test process is easy to operate and enhance readability.Compared with the chip Spec parameter standard,it can be concluded that the test accuracy is also effectively improved.Because it shortens the overall test time and improves the accuracy,it has a positive impact on improving the economic benefits of the integrated circuit industry chain.

关 键 词：集成电路测试 高速数电芯片 参数测试 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置] TP311[自动化与计算机技术—控制科学与工程]