CL-20电子束的X射线光电子能谱-气体质谱原位同步分析技术研究  

Study on Electron Beam Induced Degradation of CL-20 Based on In Situ X-ray Photoelectron Spectroscopy-Mass Spectrometry Analysis Technique

作　　者：郝晓飞[1] 朱春华[1] HAO Xiao-fei;ZHU Chun-hua(Institute of Chemical Materials,China Academy of Engineering Physics,Mianyang 621900,Sichuan China)

机构地区：[1]中国工程物理研究院化工材料研究所,四川绵阳621900

出　　处：《分析测试技术与仪器》2021年第4期240-244,共5页Analysis and Testing Technology and Instruments

基　　金：国家自然基金面上项目(21876164)。

摘　　要：X射线光电子能谱仪是材料表面元素定性和半定量分析,尤其是元素化学态分析的重要手段之一.X射线光电子能谱仪的分析腔连接质谱仪进行分析,可有效获得样品表面元素变化及气体产物,实现原位同步分析.基于炸药CL-20在光作用下存在着明显的分解现象,采用X射线光电子能谱-气体质谱同步分析方法(XPS-MS)获得CL-20在电子束作用下的表面元素及气体产物的变化.试验结果表明,随着辐照时间增加,N、O元素峰峰强迅速下降,同时质谱仪可以有效获得气态产物峰,证实XPS-MS同步分析技术能够有效地实现对固态光降解反应的原位同步追踪.X-ray photoelectron spectroscopy(XPS)is one of the important methods for qualitative and semi-quantitative analysis of surface elements of materials,especially the chemical states of the elements.By connecting mass spectrometry(MS)within its analysis cavity,surface element changes and gas products can be obtained simultaneously,thus realized the in situ analysis.Based on the obvious decomposition phenomenon of explosive CL-20 under light irradiation,the changes of surface elements and gas products of CL-20 under electron beam irradiation were obtained based on XPS-MS.The experimental results showed that with the increase of irradiation time,the peak intensity of N and O decreased rapidly,while the peak of gaseous products can be obtained effectively by mass spectrometry.The result proved that XPS-MS analysis technology can effectively realize the in situ tracking of solid state electron beam induced degradation reaction.

关 键 词：X射线光电子能谱-气体质谱同步分析 CL-20 电子束辐照 降解 

分 类 号：O657.62[理学—分析化学] O657.63[理学—化学]