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作 者:徐骏 徐建芳 周卫东 XU Jun;XU Jian-fang;ZHOU Wei-dong(Jiangsu(Danyang)Institute of High-Performance Alloy Material,Zhenjiang 212300,Jiangsu China;Zhenjiang ZhuanBo Testing Technology Co.,Ltd,Zhenjiang 212300,Jiangsu China)
机构地区:[1]江苏省(丹阳)高性能合金材料研究院,江苏镇江212300 [2]镇江专博检测科技有限公司,江苏镇江212300
出 处:《分析测试技术与仪器》2021年第4期278-285,共8页Analysis and Testing Technology and Instruments
基 金:镇江市创新能力建设计划(研发机构和科技公共服务平台,SS2016001)。
摘 要:为了得到准确且分辨率高的X射线光电子能谱(XPS)数据,采用不同制样方法对不同类型的导电、不导电和混合粉末的测试结果进行了研究.从图谱半峰宽、是否有荷电、真实性、制样效率和数据处理等方面阐述不同制样方法对测试结果的影响.试验结果表明,对于导电和不导电粉末,粘取制样略优于铟片制样,其中使用碳导电胶带制样效果更好.对于混合样品,Scotch双面胶带粘样后的测试结果优于其他3种制样方式.此外,铟片制样可作为数据处理时荷电校正的参考方法.In order to obtain accurate and high-resolution X-ray photoelectron spectroscopic(XPS)data,different sample preparation methods were used to study the XPS testing results of different types of conductive powders,non-conductive powders and mixed powders.The effect of different sample preparation methods on testing results were discussed from the aspects of half-peak width,charge,authenticity,sample preparation efficiency and data processing.The results showed that the adhesive sample preparation was better than the indium chip sample preparation for conductive powders and non-conductive powders,and the carbon conductive tape was better.For mixed samples,the results of Scotch double-sided tape were better than those of the other three sample preparation methods.In addition,the indium chip sample preparation can be used as a reference method for the charge correction in data processing.
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