空间外差干涉图调制项误差分析与校正  

Modulation distortion analysisand correction of spatial heterodyne interferogram

作　　者：王新强[1,2] 梁福梅 叶松 李树[1,2] 王方原 WANG Xinqiang;LIANG Fumei;YE Song;LI shu;WANG Fangyuan(School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin Guangxi 541004,China;Guangxi Key Laboratory of Optoelectronic Information Processing,Guilin Guangxi 541004,China)

机构地区：[1]桂林电子科技大学电子信息与自动化,桂林541004 [2]广西高校广电信息处理重点实验室,桂林541004

出　　处：《激光杂志》2021年第12期87-93,共7页Laser Journal

基　　金：国家自然科学基金(No.41561070);广西特聘专家团队项目资助;广西自然科学基金(No.2019GXNSFBA245048);广西自动检测技术与仪器重点实验室主任基金项目(No.YQ20105)。

摘　　要：空间外差光谱仪一体化制作过程的光学缺陷会导致光学仪器采集到的干涉图存在误差,将仪器的相位误差和非均匀误差共同作用下对干涉图产生的影响称为“调制项误差”。结合空间外差干涉图与光谱之间的对应关系,基于傅里叶变换的卷积特性提出了一种干涉图调制项误差校正算法以达到同时修正干涉图相位误差和非均匀误差的目的,提高光谱反演精度。对比校正前后光谱与理论光谱之间的均方误差和信噪比来定量说明校正效果。通过数据对比发现,经校正后光谱的均方误差由1.17×10^(-2)减少到8.86×10^(-5),光谱信噪比从10.36提高到30.11,体现了校正算法的有效性。The optical defects in the integrated manufacturing process of spatial heterodyne spectrometer will lead to errors in the interferogram collected by the optical instrument.The influence of the phase error and non-uniform error of the instrument on the interferogram is called"modulation term error".Combined with the corresponding relationship between spatial heterodyne interferogram and spectrum,based on the convolution characteristics of Fourier transform,a modulation term error correction algorithm of interferogram is proposed to simultaneously correct the phase error and nonuniformity error of interferogram and improve the spectral inversion accuracy.By comparing the mean square error(MSE)and signal-to-noise ratio(SNR)between the spectrum before and after correction and the theoretical spectrum,the correction effect is explained quantitatively.Through data comparison,it is found that the mean square error of the corrected spectrum is reduced from 1.17×10^(-2) to 8.86×10^(-5),and the spectral signal-to-noise ratio is increased from 10.36 to 30.11,which shows the effectiveness of the correction algorithm.

关 键 词：空间外差 干涉图 光谱 调制项 

分 类 号：O433[机械工程—光学工程]