基于PXI总线的通用自测系统子系统的设计与实现  

Design and Implementation of General Self-test System Subsystem based on PXI Bus

作　　者：汤冠楚 

机构地区：[1]江西科技学院人工智能学院,江西南昌330098

出　　处：《科学技术创新》2021年第36期159-162,共4页Scientific and Technological Innovation

摘　　要：基于PXI总线传统类的通用检测手段众多,传统检测手段中,人工测试强度大、时间长、效率低、出错率高等情况,急需开发一种用于通用检测的自检子系统。针对通用检测自检系统的任务需求,进行了自检方法的探究,揭示了一种基于重要关键仪器测试、仪器自检、多路复用器及开关灵活运用的自检方案。采用ITA和RCV接口研制设计了自检适配器;利用虚拟仪器技术开发设计了自检子系统测试程序。自测结果验证显示,此自检子系统能对通用自测系统实现精准、快速自测试的良好功能运用,为故障模块快速检测定位提供新手段。There are many general detection methods based on PXI bus. Among the traditional detection methods, manual test has the advantages of high intensity, long time, low efficiency and high error rate. It is urgent to develop a self-test subsystem for general detection. According to the task requirements of the general detection and self-test system, the self-test method is explored, and a self-test scheme based on the flexible application of important key instrument test, instrument self-test,multiplexer and switch is revealed. The bit adapter is developed and designed by using ITA and RCV interface;The test program of self inspection subsystem is developed and designed by using virtual instrument technology. The verification of self-test results shows that this self-test subsystem can realize the good function of accurate and rapid self-test for the general self-test system,and provide a new way for the rapid detection and positioning of fault modules.

关 键 词：PXI总线 通用自测 子系统 设计与实现 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]