探针电连接件的退化失效及寿命分析  

Degradation Failure and Life Analysis of Probe Electrical Connector

作　　者：邹振东 李兴圣 肖同军 贾云飞[1] 卞雷祥[1] Zou Zhendong;Li Xingsheng;Xiao Tongjun;Jia Yunfei;Bian Leixiang(School of Mechanics,Nanjing University of Science and Technology,Nanjing 210094,China;Xili ZTE Industrial Park,ZTE,Shenzhen,Guangdong 518000,China)

机构地区：[1]南京理工大学机械工程学院,南京210094 [2]中兴通讯西丽中兴工业园,广东深圳518000

出　　处：《机电工程技术》2021年第12期29-32,共4页Mechanical & Electrical Engineering Technology

基　　金：中央高校基本科研业务费专项资金项目(编号:30918011201);中兴通讯研究基金项目。

摘　　要：从一款探针电连接器使用时的快速退化失效现象出发,提出了基于失效原因的可靠性建模方法。通过分析指出其失效原因是负载电流过大导致工作温升过大,从而导致加速失效,仿真验证时通过设置合理的仿真参数保证了仿真结果的可靠性。进行了温度应力下的寿命建模,数据上结合了仿真给出的温度-电流关系和使用时的寿命次数-电流关系。方法上采用了Arrhenius温度应力退化模型和退化速率线性假定,综合考虑了失效阈值的动态影响,给出了寿命次数-温度模型,建模结果与实际寿命数据有着较好的拟合效果,并利用模型给出探针使用和改良指导。该过程与一般的基于加速退化实验的建模方法比较,数据依赖度小,可行度高,可为工程人员提供一种实用的连接器失效分析方法。A reliability modeling method based on the failure reason was proposed according to the fast degradation failure phenomenon of a probe electrical connector.It was pointed out that the failure reason was that the load current was too high and made the temperature rise too high,which led to the acceleration failure.The reliability of the simulation results was ensured by setting reasonable simulation parameters.The life modeling under temperature stress was carried out,and the temperature current relationship given by simulation and the life times current relationship in use were combined in the data.The Arrhenius temperature stress degradation model and the linear assumption of degradation rate were adopted in the method,and the dynamic effect of failure threshold was taken into account.The model was used to guide the use and improvement of the probe.Compared with the general modeling method based on accelerated degradation experiment,the process had less data dependence and higher feasibility,which could provide a practical connector failure analysis method for engineers.

关 键 词：电连接件 失效分析 有限元仿真 寿命建模 

分 类 号：TM56[电气工程—电器]