软件多缺陷定位方法研究综述  

Review of Software Multiple Fault Localization Approaches

作　　者：李征[1] 吴永豪 王海峰 陈翔[2] 刘勇[1] LI Zheng;WU Yong-Hao;WANG Hai-Feng;CHEN Xiang;LIU Yong(College of Information Science and Technology,Beijing University of Chemical Technology,Beijing 100029;School of Information Science and Technology,Nantong University,Nantong,Jiangsu 226019)

机构地区：[1]北京化工大学信息科学与技术学院,北京100029 [2]南通大学信息科学技术学院,江苏南通226019

出　　处：《计算机学报》2022年第2期256-288,共33页Chinese Journal of Computers

基　　金：国家自然科学基金(61902015,61872026,61672085);南通市应用研究计划(JC2019106)资助.

摘　　要：软件多缺陷定位(Multiple Fault Localization,简称MFL)尝试在含有多个缺陷的软件程序中自动标识出这些缺陷所在的位置.传统的缺陷定位研究一般假设被测软件内仅含有一个缺陷,而实际情况下软件内往往包含多个缺陷,因此MFL问题更加贴近实际场景.当程序中存在多个缺陷时,由于缺陷数量难以准确估计,同时缺陷之间可能存在互相干扰,因此对MFL问题的研究更具挑战性.已有研究表明传统单缺陷假设下的缺陷定位技术会随着程序中缺陷数目的增多而出现定位效果下降的问题.因此,需要对已有缺陷定位技术加以改进使其在MFL问题中具有更好的缺陷定位效果.本文以MFL研究问题为核心,对相关研究成果进行了系统的梳理.首先将已有的MFL技术细分为三类,分别是基于缺陷干扰假设的多缺陷定位方法,基于缺陷独立假设的多缺陷定位方法和不基于任何假设的多缺陷定位方法;然后依次总结了每一类方法的主要设计思想和相关研究成果,随后分析了MFL研究中经常使用的评测指标和评测对象;最后,本文从扩大评测对象的编程语言范围、考虑更多的软件程序、寻找更多的工业应用场景等多个角度对MFL的未来研究方向进行了展望.With the development of the computer and electronic information industry,computer software’s functions and scale have become increasingly complex and large,bringing unprecedented challenges to software debugging.When defects occur in the software,developers need to spend an incalculable workload to debug the software,and the first step in software debugging is to find the location of the defect,that is,the fault localization.There has been a drastic growth of research in Multiple Fault Localization(MFL)in the past few years.MFL attempts to automatically identify multiple fault locations in a software program with multiple defects.Traditional fault localization techniques generally assume that the software programs under test only contain one single defect.But in reality,the software often contains multiple defects,so the MFL problem is closer to the debugging scenarios.However,compared with the fault localization of programs containing only a single defect,MFL research is much more difficult.When multiple defects in the program under test,it is difficult to estimate the accurate number of defects in this scenario,and the multiple faults may interfere with each other,which are the problems that will not be encountered in the process of single defect fault localization;hence the MFL problem is quite a challenging problem.Studies have shown that the fault localization accuracy of techniques designed for single-fault localization will be decreased when there are multiple defects in the software programs under test.Therefore,it is necessary to improve the fault localization performance in MFL problem.This survey takes the MFL research problem as the core and offers a systematic overview of existing research achievements.In this survey,we firstly classified these MFL techniques into three groups,which are Defect Interference Hypothesis based MFL(INF-MFL),Defect Independence Hypothesis based MFL(IDP-MFL),and None Hypothesis based MFL(NOH-MFL).INF-MFL method only locates and repairs a single defect each time during deb

关 键 词：软件调试 多缺陷定位 缺陷干扰 缺陷独立 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]