裂解碳五中硅的定性及脱除  

Characterization and removal of silicon in cracked C5

作　　者：王龙庆 李云涛 王涛 刘泓江 胡倩 张美婷 WANG Longqing;LI Yuntao;WANG Tao;LIU Hongjiang;HU Qian;ZHANG Meiting(Fushun Yikesi New Material Co.,Ltd.,Fushun Liaoning 113004,China)

机构地区：[1]抚顺伊科思新材料有限公司,辽宁抚顺113004

出　　处：《山西化工》2022年第1期13-16,共4页Shanxi Chemical Industry

基　　金：抚顺市“抚顺英才计划”项目资助(FSYC202107002)。

摘　　要：对裂解碳五原料中硅的含量进行了分析,采用气质联用仪对硅的形态进行了定性分析。利用裂解碳五预处理精馏塔对脱除硅的工艺条件进行研究,研究了裂解碳五预处理精馏塔操作条件如进料温度、进料板位置、塔顶物料采出量等变化对硅脱除效果的影响。The content of silicon in cracking C5 raw material was analyzed,and the morphology of silicon was qualitatively analyzed by GC-MS.The process conditions of silicon removal were studied by using cracking C5 pretreatment distillation column.The effects of the operating conditions of cracking C5 pretreatment distillation column,such as feed temperature,feed plate position and top material recovery,on the silicon removal effect were studied.

关 键 词：脱硅 气质联用仪 工艺条件 

分 类 号：TQ031.3[化学工程]