高温对冬小麦旗叶光合机构的伤害机制  

Photosystem damage mechanism in flag leaves of winter wheat under high temperature

作　　者：杨程[1] 李向东[1] 杜思梦 张德奇[1] 时艳华[1] 王汉芳[1] 邵运辉[1] 方保停[1] 程红建[1] 位芳[2] YANG Cheng;LI Xiangdong;DU Simeng;ZHANG Deqi;SHI Yanhua;WANG Hanfang;SHAO Yunhui;FANG Baoting;CHENG Hongjian;WEI Fang(Wheat Research Institute,Henan Academy of Agricultural Sciences/National Laboratory of Wheat Engineering/Key Laboratory of Wheat Biology and Genetic Breeding in Central Huang-Huai Region,Ministry of Agriculture/Scientific Observing and Experimental Station of Crop Cultivation in Central Plains,Ministry of Agriculture/Henan Provincial Key Laboratory of Wheat Biology,Zhengzhou 450002,China;School of Agricultural Sciences,Zhengzhou University,Zhengzhou 450052,China)

机构地区：[1]河南省农业科学院小麦研究所/小麦国家工程实验室/农业部黄淮中部小麦生物学与遗传育种重点实验室/农业部中原地区作物栽培科学观测实验站/河南省小麦生物学重点实验室,郑州450002 [2]郑州大学农学院,郑州450052

出　　处：《中国生态农业学报（中英文）》2022年第3期399-408,共10页Chinese Journal of Eco-Agriculture

基　　金：河南省农业科学院优秀青年科技基金计划(2022YQ02);国家自然科学基金项目(31601242);河南省农业科学院基本科研业务费资助。

摘　　要：高温胁迫下小麦光合能力下降是影响小麦灌浆和导致产量下降的主要因素。探明高温对小麦旗叶光合机构的伤害机制有助于小麦高温抗性资源的合理利用。本研究选取35个河南省不同年代的主栽小麦品种,在离体条件下采用快速叶绿素荧光、820 nm光反射、延迟荧光同步测定的方法,对不同温度(22℃,30℃,38℃)处理下所有小麦品种光合电子传递活性相关参数进行了测定和分析。首先根据最大光化学效率(F_(V)/F_(M))对高温的敏感程度将35个小麦品种分为高温不敏感(G1)和高温敏感(G2)两种类型,然后对所测参数分别平均,结果显示高温胁迫下两种类型小麦品种光系统Ⅱ(PSⅡ)的光能捕获效率、吸收的光能推动电子传递到初级醌受体(Q_(A))下游和光系统Ⅰ(PSⅠ)末端的效率、质体醌(PQ)库的再还原能力高温下均显著下降,但G2小麦品种下降幅度更大;两种类型小麦品种PSⅠ活性均不受影响,但G2小麦品种PSⅠ供体侧电子传递活性下降幅度大于G1小麦品种。通过3种研究方法的相互补充和印证,最终表明PSⅡ反应中心活性、PSⅡ光能的捕获和Q_(A)向下游传递电子的能力的差异是导致两种类型小麦品种光合电子传递活性差异的主要原因,PSⅡ供体侧和PSⅠ活性对小麦光系统Ⅱ高温抗性没有直接影响。该研究对未来冬小麦抗高温品种选育和栽培管理技术的创新提供了参考。High temperatures are one of the main environmental stresses at the filling stage of winter wheat.The reduction in wheat photosynthesis caused by heat stress affects the filling of wheat and reduces grain yield.China is rich in wheat cultivars,and their photosynthetic sensitivity to high temperatures varies.Investigating the mechanism of high-temperature damage to the photosynthetic apparatus of wheat flag leaves can help to rationalize wheat high-temperature resistance resources.In this study,35 wheat cultivars planted widely in Henan Province during different historical periods were selected.The parameters related to photosynthetic electron transfer of all wheat cultivars were measured and analyzed using fast chlorophyll fluorescence,820 nm light reflection,and delayed fluorescence synchronization determination.First,according to the maximum photochemical efficiency(F_(V)/F_(M))under high temperature,35 wheat cultivars were divided into two groups:high-temperature insensitivity and high-temperature sensitivity,and the parameters measured for the two types of wheat cultivars were averaged.The results showed that J and I points of chlorophyll fluorescence induction curves were raised and the maximum quantum yield for primary photochemistry(φP_(O)),quantum yield for electron transport(φE_(o)),quantum yield for reduction of end electron acceptors at the PSⅠ acceptor side(φR_(o)),and performance index(PI_(ABS))were significantly reduced in the two types of wheat cultivars under high-temperature stress.Moreover,the rise and decrease extents of high-temperature sensitive type were greater than those of high-temperature insensitive type,indicating that the PSⅡ light energy capture efficiency,the efficiency of the absorbed light energy to drive electrons downstream of the primary electron quinone acceptor Q_(A),its efficiency to the PSⅠ end,and the re-reduction ability of the PQ pool decreased more in the leaves of the sensitive wheat cultivars under high temperatures.There was no significant decrease in the ma

关 键 词：高温 光合机构 快速叶绿素荧光 延迟荧光 820 nm光反射 冬小麦 耐高温类型 

分 类 号：S184[农业科学—农业基础科学]