基于CHROMA和FPGA的芯片FT测试系统的研究  

作　　者：范耀华 童杰 苏江[1] 陈建丽[1] 

机构地区：[1]广东科学技术职业学院,广东珠海519090

出　　处：《科技创新与应用》2022年第5期18-21,共4页Technology Innovation and Application

基　　金：广东省教育厅工程中心团队项目(2021GCZX018)。

摘　　要：文章在分析芯片测试一般测试系统方案的基础上,以Chroma 8000商用测试机为例,提出加入FPGA作为测试机和芯片通信的中间桥梁的测试方案。对新的测试系统方案和一般系统方案简单对比,从而具体介绍新测试方案的组成、结构,阐述新方案在芯片测试各部分间的协调作用和具体的工作方式,分析该方案相对于一般测试方案的特性,并举例说明该方案测试SOC芯片的步骤。最后对该方案进行展望,简单说明该方案的应用前景。Based on the analysis of the general test system scheme of chip testing, this paper takes the Chroma 8000 commercial test machine as an example, and puts forward a test scheme which adds FPGA as the intermediate bridge between the test machine and the chip communication. This paper makes a simple comparison between the new test system scheme and the general system scheme, and then introduces the composition and structure of the new test scheme, and expounds the coor-dination function and specific working mode of the new scheme in each part of the chip test. Finally, the characteristics of this scheme compared with the general test scheme are analyzed, and an example is given to illustrate the steps of this scheme to test SOC chips. Finally, the prospect of the scheme is made, and the application prospect of the scheme is briefly explained.

关 键 词：芯片测试 FPGA Chroma 8000 测试方案 

分 类 号：TN407[电子电信—微电子学与固体电子学]