一种数字芯片故障检测仪设计  

Design of Digital Chip Fault Detector

作　　者：华国环[1] 徐瀚文 桑春洋 张文锋 HUA Guohuan;XU Hanwen;SANG Chunyang;ZHANG Wenfeng(College of Electronic&Information Engineering,Nanjing University of Information Science&Technology,Nanjing 210044,China)

机构地区：[1]南京信息工程大学电子与信息工程学院,南京210044

出　　处：《实验室研究与探索》2022年第1期80-84,100,共6页Research and Exploration In Laboratory

基　　金：国家自然科学基金项目(12074192);江苏高校优势学科III期建设工程资助项目(PAPD)。

摘　　要：设计了一款数字芯片故障检测仪,该检测仪能够方便、快捷地分析芯片的故障,并准确定位芯片的故障引脚。所设计的检测仪利用芯片内部各引脚的静电泄放保护机制,配合霍尔电流线圈检测芯片的短路和开路故障。同时根据芯片的功能定义,由MCU产生相应的激励信号,通过芯片的输出响应是否正确判断其有无逻辑故障,并且通过电脑端和液晶屏实时显示检测结果。测试结果表明,该检测仪的准确率高达99.6%,待机功耗只有0.36 W,具有小型化便携式特点。In order to prevent students from using damaged digital chips in the experimental process,a digital chip fault detector is designed.The detector can conveniently and quickly verify the quality of the chip,and accurately locate the fault pin of the chip.The detector uses the electro-static discharge protection mechanism of each pin in the chip and the Hall current coil to detect the short circuit and open circuit faults of the chip.According to the function definition of the chip,MCU provides the corresponding excitation signal,and then judges whether there is logic fault through that the output response of the chip is correct.The real-time test results can be shown on the computer screen or LCD screen.It can be seen from the test results that the standby power consumption of the detector is only 0.36 W,and the accuracy is over 99.6%.It is easy to be miniaturized and portable.

关 键 词：数字逻辑芯片 静电放电保护 故障字典 检测故障 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]