一种弹载信息处理器NAND Flash高可靠数据管理方法  

A Highly Reliable Data Management Method of Missile Information Application Based on NAND Flash

作　　者：朱旭锋[1] 郭佳鑫 胡晓晴 梁建强 张红 Zhu Xufeng;Guo Jiaxing;Hu Xiaoqing;Liang Jianqiang;Zhang Hong(Beijing Aerospace Automatic Control Institute,Beijing 100854,China)

机构地区：[1]北京航天自动控制研究所,北京100854

出　　处：《航天控制》2022年第1期76-82,共7页Aerospace Control

基　　金：核高基重大科技专项(2017ZX01013101-002)。

摘　　要：为解决弹载信息处理器NAND Flash存取关键数据时,采用坏块管理和数据备份机制仍然无法避免的数据错误问题,提出一种NAND Flash全生命周期高可靠数据管理方法:以DSP软件进行坏块管理为基础,结合一种基于FPGA的改进BCH ECC校验算法,对弹载信息处理器NAND Flash全生命周期进行坏块检测评价,来提高数据管理的可靠性。提出的改进BCH ECC校验算法,采用PE单元复用方式实现读取NAND Flash数据时检9纠8实时检测。相比传统BCH ECC校验算法,该算法检测准确,占用FPGA逻辑资源少,检测速度快,非常适合高可靠性、强实时性弹载信息处理器应用场合。仿真效验结果表明,采用该方法可有效提高NAND Flash数据管理可靠性。As bad block management and data backup methods can not ensure data reliability for accessing NAND Flash data in missile borne information application, a set of highly reliable data management method for the NAND Flash whole life cycle is proposed: the new data management method is based on the bad block management by DSP software, and is combined with an improved BCH ECC algorithm based on FPGA. Moreover, the improved BCH ECC algorithm which uses PE Unit multiplexing to realize the real-time detection of checking 9 bit data error, checking and correcting 8 bit data error for reading NAND Flash data. By comparing with the traditional BCH ECC algorithm, the new algorithm not only can realize the data accuracy detection, but also can realize less FPGA logic resources and more fast detection speed. Thus,the new BCH ECC algorithm is very suitable for missile borne information application,which has high reliability and strong real-time performance. Simulation results and experimental results show that the reliability of NAND Flash data management can be improved by using this method.

关 键 词：NAND Flash 坏块管理 错误检查和纠正 高可靠 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]