积屑瘤非相关荧光显示的控制  

Control of unrelated fluorescence indication of build-up edge

作　　者：王乃翠 杨学兵 万磊 唐建朝 李雪婷 WANG Naicui;YANG Xuebing;WAN Lei;TANG Jianchao;LI Xueting(AECC Xi’an Aero-Engine Co.,Ltd.,Xi’an 710021,China;The President’s Office of Chang’an University,Xi’an 710021,China)

机构地区：[1]中国航发西安航空发动机有限公司,西安710021 [2]长安大学校长办公室,西安710021

出　　处：《无损检测》2022年第1期53-55,79,共4页Nondestructive Testing

摘　　要：针对零件在机加工后,其圆角根部产生的积屑、积屑瘤等导致材料表面缝隙变得紧密,引起非相关荧光显示,易造成缺陷漏检的问题,通过对实际检测案例的分析,找出机械加工积屑瘤引起荧光痕迹显示的原因,并采用相关处理措施,避免了该类问题的发生。Aiming at the problems of the accumulation of chips and build-up on the root of the fillet after the components were machined, which causes the gaps on the surface of the material to become tight and irrelevant fluorescents display, and easily leaded to missing inspection of defects.In this article, an experimental analysis on existing inspection case was conducted and the causes leading to the fluorescent trace indication of machining build-up edge were found out, and some relevant treatment measures were taken to avoid such problems.

关 键 词：荧光渗透检测 非相关显示 积屑瘤 超声波清洗 

分 类 号：TG115.28[金属学及工艺—物理冶金]