三结太阳电池低频噪声特性与可靠性表征研究  

RESEARCH ON LOW-FREQUENCY NOISE AND RELABILITY CHARACTERIZATION OF TRIPLE-JUNCTION SOLAR CELLS

作　　者：余永涛[1] 孙宇[1] 王小强[1] 罗宏伟[1] 罗军 肖文杰 Yu Yongtao;Sun Yu;Wang Xiaoqiang;Luo Hongwei;Luo Jun;Xiao Wenjie(The Fifth Electronics Research Institute of Ministry of Industry and Information Technology,Guangzhou 511300,China;701 Factory of PLA Navy,Beijing 100015,China)

机构地区：[1]工业和信息化部电子第五研究所,广州511300 [2]中国人民解放军海军701工厂,北京100015

出　　处：《太阳能学报》2022年第2期163-168,共6页Acta Energiae Solaris Sinica

基　　金：广东省重点领域研发计划(2018B010142001)。

摘　　要：以GaInP/InGaAs/Ge三结太阳电池为研究对象,通过宽范围电流偏置条件下的低频噪声测试和高温应力试验,对三结太阳电池的低频噪声特性和可靠性表征进行研究分析。结果表明,三结太阳电池的低频噪声包括1/f噪声和G-R噪声。在宽范围电流偏置条件下,低频噪声随偏置电流呈先增大后减小的规律,并在频率为500 Hz时出现G-R噪声特征。高温应力试验后,太阳电池在小电流偏置条件下的低频噪声明显增大,与器件暗I-V特性的变化一致,归因于热应力诱发的器件缺陷。相对于单频点噪声参数,宽频带噪声参数可更准确稳定地表征太阳电池可靠性。Low-frequency noise characteristic of GaInP/InGaAs/Ge triple-junction solar cells is studied through high temperature stress test and noise test under a wide range of bias current. Experimental results demonstrate that the noise types observed in triple-junction solar cells are 1/f noise and G-R noise. The noise firstly increases to the maximum value and then decreases with the bias current. The typical G-R noise is observed at 500 Hz. After high temperature stress test of triple-junction solar cells,the noise magnitude increases evidently at the lower bias current,which could be attributed to device defects induced by thermal stress. And the dark I-V characteristic of solar cells exhibits consistent performance. Compared with single frequency noise parameters,wideband noise is more sensitive and accurate in indicating solar cells reliability.

关 键 词：太阳电池 噪声 三结 可靠性 偏置电流 高温应力 

分 类 号：TM914.4[电气工程—电力电子与电力传动]