磁性测厚仪的测量系统分析  

Measurement system analysis of magnetic thickness gauge

作　　者：杨志业[1] 李阳 王进军[1] 耿莽河 郭燕[1] YANG Zhiye;LI Yang;WANG Jinjun;GENG Manghe;GUO Yan(AVIC Shenyang Aircraft Corporation,Shenyang 110034,China)

机构地区：[1]沈阳飞机工业(集团)有限公司,辽宁沈阳110034

出　　处：《电镀与涂饰》2022年第4期295-297,共3页Electroplating & Finishing

摘　　要：根据测量系统分析方法,在镀层厚度为7.6~15.2μm的条件下对某磁性测厚仪的测量系统能力进行评估,并考察了基体粗糙度、校准方法和结果统计方法对测量系统能力的影响。结果表明,基体粗糙度(Ra)小于1.6μm,采用两点校准(含零点),并以ASTM B499-09标准规定的舍点法进行统计时,测量系统能力较高,但仍不满足精确性公差比(P/T)小于30%的要求。The measurement system capability of a magnetic thickness gauge for the electroplated coatings with a thickness ranging from 7.6μm to 15.2μm was evaluated based on the measurement system analysis theory.The effects of the roughness of substrate,the calibration of the magnetic thickness gauge,and the statistical method of results on the measurement system capability were studied.The results showed that the magnetic thickness gauge calibrated by two-point method including zero point had a relatively high measurement system capability when the roughness(Ra)of the substrate was lower than 1.6μm and the readings were discarded according to ASTM B499-09 standard.However,it did not meet the requirement of precision to tolerance ratio(P/T)<30%.

关 键 词：镀层厚度 磁性法 测量系统能力 基体粗糙度 校准 读数 

分 类 号：TH821[机械工程—仪器科学与技术] TQ153.17[机械工程—精密仪器及机械]