车规级芯片电磁兼容研究进展  

Research Progresses on Electromagnetic Compatibility of Automotive-grade Chips

作　　者：吴建飞[1,2] 郑亦菲 李彬鸿 张红丽 赵星 刘培国[1] Wu Jianfei;Zheng Yifei;Li Binhong

机构地区：[1]国防科技大学 [2]天津先进技术研究院 [3]中国科学院微电子研究所 [4]广东省大湾区集成电路与系统应用研究院

出　　处：《安全与电磁兼容》2022年第2期16-23,共8页Safety & EMC

基　　金：中国航天科技集团有限公司第八研究院产学研合作资助项目(编号:SAST2021-069)。

摘　　要：车规级芯片电磁兼容(EMC)技术关乎汽车特定电子系统及其周围电子系统运行的安全可靠性,目前国内缺少可以筛选具有良好电磁兼容性能的汽车电子芯片的标准方法,以及提前预测芯片EMC性能的模拟建模方法。文章基于国内外资料调研和课题组的研究成果,综述了车规级芯片在EMC测试方法、建模仿真方面的研究成果,并配合实际案例,介绍了汽车电子芯片的EMC测试流程及方法,通过仪器测量和IC_EMC软件的数据处理,建立微控制单元(MCU)的瞬态脉冲抗扰度的行为级模型,旨在为汽车电子设计人员提供测试及建模方面的参考。Automotive-grade chip EMC technology is concerned with the safety and reliability of the operation of specific electronic systems and their surrounding electronics in automobiles.At present,there is a lack of standard methods that can screen automotive electronic chips with good electromagnetic compatibility performance and simulation modeling methods that predict the EMC performance of chips in advance.This paper is based on domestic and international data research and the research results of the group.The current research status of EMC testing methods,modeling and simulation of automotive grade chips is reviewed,and through the analysis of practical cases,the EMC testing process and method of automotive electronic chips are introduced,and the behavioral level model of transient pulse immunity of Microcontroller Unit(MCU)is established by instrument measurement and data processing of IC_EMC software,aiming to provide reference for automotive electronic designers in testing and modeling.

关 键 词：车规级芯片 电磁兼容 建模仿真 辐射发射 电磁敏感度 

分 类 号：U463.6[机械工程—车辆工程] TN03[交通运输工程—载运工具运用工程]