针对复杂路径条件的固件测试方法改进  

Improved Firmware Test Method for Complex Path Conditions

作　　者：王丽娜[1] 张增光 张桐 陈思 WANG Lina;ZHANG Zengguang;ZHANG Tong;CHEN Si(Key Laboratory of Aerospace Information Security and Trusted Computing,Ministry of Education,School of Cyber Science and Engineering,Wuhan University,Wuhan 430072,Hubei,China)

机构地区：[1]空天信息安全与可信计算教育部重点实验室武汉大学国家网络安全学院,湖北武汉430072

出　　处：《武汉大学学报（理学版）》2022年第1期51-56,共6页Journal of Wuhan University:Natural Science Edition

基　　金：国家自然科学基金(U1836112,61876134);国家自然科学基金重点项目(U1536204)。

摘　　要：针对当前固件模糊测试方案在测试具有复杂路径条件的固件时开销较大并且效率低下的问题,提出了一种高效省时的固件测试改进方法。该方法根据固件与外设交互使用的通信协议来修改模糊测试器产生的测试用例,使得测试用例可以突破校验和检查这一复杂路径条件。使用该方法改进了固件测试方案p2im(processor-peripheral interface modeling)。真实场景下的固件测试结果表明,改进的方案(improved processor-peripheral interface modeling,Ip2im)在固件测试中基本块覆盖率和函数覆盖率都有提升,可以成功绕过固件的校验和检查。The currently proposed firmware fuzzing test schemes are expensive and inefficient when testing firmware with complex path conditions.To solve this problem,an efficient firmware test improvement method is proposed.This method modifies the test cases generated by the fuzzer according to the communication protocol used by the firmware and peripherals to interact,so that the test cases can break through the complex path condition of checksum checking.This method is used to improve the firmware test program p2im(processor-peripheral interface modeling).The firmware test results in two real scenarios show that the improved p2im(Ip2im)improves the basic block coverage and function coverage,and can successfully bypass the checksum check of the firmware.

关 键 词：嵌入式设备 固件 模糊测试 复杂路径条件 校验和 

分 类 号：TP309[自动化与计算机技术—计算机系统结构]