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作 者:安哲毅 张楠[1] AN Zheyi;ZHANG Nan(Electronic Materials Research Laboratory,Key Laboratory of the Ministry of Education&International Center for Dielectric Research,School of Electronic Science and Engineering,Xi'an Jiaotong University,Xi'an 710049,China)
机构地区:[1]西安交通大学电子科学与工程学院,电子陶瓷与器件教育部重点实验室暨国际电介质研究中心,西安710049
出 处:《硅酸盐学报》2022年第3期661-681,共21页Journal of The Chinese Ceramic Society
基 金:国家自然科学基金委员会面上项目(12074304);111引智计划(B14040)。
摘 要:晶体材料的局部结构是对长程有序平均结构的偏离,随着技术的进步和多年来的深入探究,局部结构对材料性能的深刻影响逐渐被学界所认识,对局部结构的探索为材料的性能提升和器件开发提供了关键理论指导。另一方面,铁电材料往往具备十分复杂的局部结构,并且局部结构对平均结构的偏离十分微小,对其进行准确表征具有很大挑战性。本工作针对国际上较为通用的局部结构表征手段进行了综述,主要包括基于X射线和中子进行的单晶漫散射实验技术和粉末全散射实验技术,以及相关数据分析和结构模型构建方法;此外,对散射技术用于铁电压电材料局部结构表征的典型范例进行了回顾。For crystalline materials, atomistic local structures are deviations from their long-range average crystal structures. With the recent development of experimental techniques and in-depth investigation methods for probing local structures, it has been realized and understood that local structures have profound influences on the physical properties of functional materials, and the understanding of local structures provides theoretical instructions for the improvements of materials performances as well as development of novel applications. This review summarized the well-established X-ray and neutron scattering techniques, data analysis and model refinements mothods in the local-structure investigation researches;in addition, examples of local structural investigations for several classical ferroelectric perovskites are reviewed.
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