一种可编程式模拟芯片自动测试方法及其应用  

A programmable automatic testing method and application for analog chip

作　　者：李演明[1] 黄晟睿 邓新安 张春红 沈宇衡 LI Yanming;HUANG Shengrui;DENG Xin’an;ZHANG Chunhong;SHEN Yuheng(School of Electronic and Control Engineering,Chang’an University,Xi’an 710064,China)

机构地区：[1]长安大学电子与控制工程学院,陕西西安710064

出　　处：《现代电子技术》2022年第8期29-34,共6页Modern Electronics Technique

基　　金：陕西省重点研发计划项目(2019ZDLGY15-04-02);西安市科技计划项目(201805045YD23CG29(2));国家自然科学基金项目(61704009)。

摘　　要：针对电池保护芯片的传统测试方法的缺点和测试需求,文中基于ACCOTEST STS8200测试平台,设计一种用于电池保护芯片的自动测试方案。首先分析电池保护芯片的过充、过放、过流及过温等功能测试需求,给出测试电路;然后针对芯片的各项关键指标依次设计测试程序,并提出一种基于可编程控制的OTP Trimming算法;最后,设计测试板并在测试机上进行测试验证。文中提出的测试方案采用软件菜单选项和野口转接板设计方法,可大大缩短芯片测试的开发周期。结果表明,在测试31 631颗芯片后,芯片的测试良率为99.35%,且Trimming后数据的均值为2 254 mV,标准差为1.766。说明文中测试方案有效且可靠性较高,达到了可编程控制的灵活性要求。In allusion to the disadvantages and testing requirements of traditional testing methods for battery protection chip,an automatic testing scheme for battery protection chip is designed based on the ACCOTEST STS8200 testing platform.The testing requirements of battery protection chip’s functions,such as over-charge,over-discharge,over-current and overtemperature tests are analyzed,and then the testing circuit is given. The testing programs are designed respectively according to the key indexes of the chip,and an OTP Trimming algorithm based on programmable control is proposed. The testing board is designed and verified on the test machine. The software menu option and field port adapter board design method are adopted in the proposed scheme,which can greatly shorten the development cycle of chip testing. The testing results show the test yield of chips can reach 99.35% in the testing of 31631 chips,the mean value of the data after Trimming is 2254 mV,and the standard deviation is 1.766. It can be seen that the testing scheme is effective and has high reliability,which can meet the flexibility requirements of programmable control.

关 键 词：模拟芯片 自动测试方法 OTP Trimming技术 芯片功能测试 测试板设计 测试验证 

分 类 号：TN407-34[电子电信—微电子学与固体电子学]