硅像素探测器阈值刻度法的研究  

The Design of Threshold Calibration Algorithm for the Silicon Pixel Detector Research

作　　者：张研[1] 李兰坤 刘鹏[1] 丁叶 李贞杰[1] ZHANG Yan;LI Lan-kun;LIU Peng;DING Ye;LI Zhen-jie(Institute of High Energy Physics,Beijing 100049,China;Zheng Zhou University,Zhenzhou 450001,China)

机构地区：[1]中国科学院高能物理研究所,北京100049 [2]郑州大学,郑州450001

出　　处：《核电子学与探测技术》2021年第5期901-904,共4页Nuclear Electronics & Detection Technology

摘　　要：本文主要介绍了应用于同步辐射光源的硅像素探测器阈值刻度方法,包括S-curve原理、分块刻度方案、阈值与能量、幅度关系以及阈值调整算法。并按该方法对硅探测器进行了阈值刻度、对比了刻度前后的数据,实验结果表明阈值刻度后探测器达到了设计指标,可应用于同步辐射实验。This article introduces the threshold calibration method of silicon pixel detector mainly used in synchrotron radiation light source,including S-curve principle,block calibration method,the relationship of threshold energy,amplitude and threshold adjustment algorithm.Based on this method,the detector is calibrated and the results before and after calibration are compared.The test results show that the detector meets the requirements and can be used in synchrotron radiation experiment.

关 键 词：硅像素探测器 刻度 阈值法 同步辐射 

分 类 号：TL81[核科学技术—核技术及应用]