基于HALT和HASS试验的可靠性技术发展概述  

Review of the Development of Reliability Technology Based on HALT and HASS

作　　者：张玲 罗雨薇 邱忠文[3] ZHANG Ling;LUO Yuwei;QIU Zhongwen(The 24th Research Institute of CETC,Chongqing 400060,China;Chongqing Acoustic-Optic-Electronic Co.,Ltd.of China Electronics Technology Group Corporation,Chongqing 400060,China)

机构地区：[1]中国电子科技集团公司第二十四研究所检测中心,重庆400060 [2]中电科技集团重庆声光电有限公司,重庆400060 [3]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《电子产品可靠性与环境试验》2022年第1期87-91,共5页Electronic Product Reliability and Environmental Testing

摘　　要：元器件的质量与可靠性是电路质量与可靠性的关键和核心,可靠性的核心是预防故障,通过在设计阶段实施HALT,研制阶段实施HASS试验,能有效地提高产品的可靠性。简单地介绍了HALT和HASS试验,并对其应力确定、设计过程作逐一介绍。最后,对HASS和HALT试验技术的应用做了简要概述。The quality and reliability of components are the key of circuit quality and reliability and the core of reliability is to prevent faults.Through the implementation of HALT in the design stage and HASS in the development stage,the reliability of products can be effectively improved.The HALT and HASS test are introduced briefly,and the process of stress determination and design is introduced one by one.Finally,the application of HASS and HALT test techniques is briefly summarized.

关 键 词：高加速寿命试验 高加速应力筛选 寿命试验 

分 类 号：TB114.3[理学—概率论与数理统计]