一种嵌入式操作系统快速测试系统的设计与实现  

Design and Implementation of a Fast Test System for Embedded Operating System

作　　者：王振 张超永 李亚爽 刘静静 李国杰 韩悦 Wang Zhen

机构地区：[1]许继电气股份有限公司,河南许昌461000

出　　处：《工业控制计算机》2022年第3期10-12,共3页Industrial Control Computer

摘　　要：当前嵌入式系统测试大多是对测试用例单独编码,通过仿真器逐一调试完成,效率较低。为提高嵌入式操作系统的测试效率,提出了一种通过在PC端界面操作快速编辑用例、目标板卡端统一的处理执行测试用例、简洁高效的通讯报文、测试信息采集、测试用例可重用且支持快速保存导入、自动识别测试结果等功能软件,实现嵌入式操作系统快捷高效的测试方法。解决现有嵌入式系统测试效率较慢的问题,有效地提高了测试效率和质量,减少因测试用例编码错误而引起的测试错误。At present,most of the embedded system testing is to code the test cases individually and debug them one by one through the emulator,which is inefficient.In order to improve the test efficiency of the embedded operating system,this paper proposes a way to realize quick editing of use cases by operating on the PC side interface,unified processing and execution test cases on the target board side,concise and efficient communication messages,test information collection,and test cases Reusable and support fast saving and importing,automatic identification of test results and other functional software to achieve fast and efficient testing methods for embedded operating systems.Solve the problem of slow test efficiency of existing embedded systems,effectively improve test efficiency and quality,and reduce test errors caused by test case coding errors.

关 键 词：嵌入式系统 快速测试 界面编辑用例 自动识别 用例可重用 

分 类 号：TP368.1[自动化与计算机技术—计算机系统结构]