拉盖尔-高斯光束在拓扑绝缘体分层介质薄膜的相位分布  

Phase Distribution of Laguerre-Gaussian Beams on a Layered Topological Insulator Dielectric Film

作　　者：孟惠 王明军[2] 宁铎[3] 任神河 Meng Hui;Wang Mingjun;Ning Duo;Ren Shenhe(College of Physics&Electronic Engineering,Xianyang Normal University,Xianyang,Shaanxi 712000,China;School of Automation,Xi’an University of Technology,Xi’an,Shaanxi 710021,China;School of Electrical&Control Engineering,Shaanxi University of Science and Technology,Xi’an,Shaanxi 710021,China)

机构地区：[1]咸阳师范学院物理与电子工程学院,陕西咸阳712000 [2]西安理工大学自动化学院,陕西西安710021 [3]陕西科技大学电气与控制工程学院,陕西西安710021

出　　处：《激光与光电子学进展》2022年第5期296-301,共6页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(61771385)。

摘　　要：拓扑绝缘体(TI)是一种具有特殊能带结构的新型量子物态。它的体内结构像绝缘体一样不导电,而表面像导体一样具有金属性能够导电,能够实现无损耗传播能量和信息,良好的光学透射率。利用平面角谱展开法和传输矩阵理论研究了拉盖尔-高斯(LG)光束入射分层拓扑绝缘体(TI)薄膜的相位分布特征。数值结果表明,反射场和透射场中LG光束的相位结构会随着拓扑磁电极化率(TMEP)的变化而变化,尤其是p波的相位分布中心轴发生左移或者右移的现象。拉盖尔-高斯LG光束入射分层拓扑绝缘体介质薄膜相位分布特征在无线激光通信、光学囚禁、微粒操纵、非线性光学以及信息编码等领域有一定意义。Herein,the phase distribution characteristics of Laguerre-Gaussian(LG)beams incident on a layered topological insulator(TI)thin film are studied using the plane angular spectrum expansion method and transmission matrix theory.Numerical results show that the phase structure of LG beams in the reflected and transmitted fields is affected by the changes in topological magneto-electric polarizability.Particularly,the center axis of the phase distribution of p-wave shifts left or right.This research on the phase distribution characteristics of LG beams incident on layered topological insulator thin films has significance in wireless laser communication,optical trapping,particle manipulation,nonlinear optics,information coding,and other fields.

关 键 词：表面光学 拉盖尔-高斯光束 拓扑绝缘体 相位结构 分层介质 传输矩阵理论 

分 类 号：O436[机械工程—光学工程]