一种大量程端度孔径测量瞄准装置的设计  

Aiming Device Design of a Large-scale End Measurement and Hole Diameter Measurement

作　　者：武文彬[1] 任冬梅[1] 李华丰[1] WU Wenbin;REN Dongmei;LI Huafeng(Beijing Changcheng Institute of Metrology and Measurement,Beijing 100095,China)

机构地区：[1]中国航空工业集团公司北京长城计量测试技术研究所,北京100095

出　　处：《机械工程师》2022年第4期142-144,147,共4页Mechanical Engineer

摘　　要：端度和孔径的测量采用光电显微瞄准装置进行瞄准,光栅尺或激光干涉仪作为测长系统,从而实现端度测量和二等及以下环规尺寸的测量要求,而对较大面宽度的端度件及较大尺寸的孔径类被测件缺乏有效方法。文中通过对光电显微瞄准装置的光路仿真设计及机械配件设计,采用增大显微物镜焦距的设计方法,实现测量范围达到3~300 mm的大量程端度孔径测量瞄准装置的设计。The end measurement and hole diameter measurement adopts photoelectric microscope aiming device as aiming device.A grating ruler or a laser interferometer is used as a length measuring system,so as to meet the measurement requirements of end measurement and ring gauge size of the second and lower grades.There is a lack of effective methods for test pieces with larger-widths end-pieces and larger-sized hole diameter.Through the optical path simulation design and mechanical accessories design of the photoelectric microscope aiming device,this paper adopts the design method of increasing the focal length of the microscope objective lens,and realizes the large-scale end measurement and hole diameter measurement aiming device with a measurement range of 3-300 mm.

关 键 词：光电显微瞄准装置 端度 环规 光学设计 机械设计 

分 类 号：TB22[天文地球—大地测量学与测量工程]