In-situ/operando characterization techniques for organic semiconductors and devices  

作　　者：Sai Jiang Qinyong Dai Jianhang Guo Yun Li 

机构地区：[1]School of Microelectronics and Control Engineering,Changzhou University,Changzhou 213164,China [2]National Laboratory of Solid-State Microstructures,School of Electronic Science and Engineering,Collaborative Innovation Center of Advanced Microstructures,Nanjing University,Nanjing 210093,China

出　　处：《Journal of Semiconductors》2022年第4期13-23,共11页半导体学报（英文版）

基　　金：support from Natural Science Foundation of Jiangsu Province (grant number BK20211507);National Natural Science Foundation of China (grant number 61774080);the start-up funds from Changzhou University。

摘　　要：The increasing demands of multifunctional organic electronics require advanced organic semiconducting materials to be developed and significant improvements to be made to device performance. Thus, it is necessary to gain an in-depth understanding of the film growth process, electronic states, and dynamic structure-property relationship under realistic operation conditions, which can be obtained by in-situ/operando characterization techniques for organic devices. Here, the up-todate developments in the in-situ/operando optical, scanning probe microscopy, and spectroscopy techniques that are employed for studies of film morphological evolution, crystal structures, semiconductor-electrolyte interface properties, and charge carrier dynamics are described and summarized. These advanced technologies leverage the traditional static characterizations into an in-situ and interactive manipulation of organic semiconducting films and devices without sacrificing the resolution, which facilitates the exploration of the intrinsic structure-property relationship of organic materials and the optimization of organic devices for advanced applications.

关 键 词：in-situ/operando characterization organic semiconductors structure-property relationship 

分 类 号：TN303[电子电信—物理电子学]