EMCCD倍增增益老化分析与评价技术  

EMCCD Multiplication Gain Aging Analysis and Evaluation Technology

作　　者：李钦 吴琼瑶[1] 伍明娟 林珑君 段大川 林雪梅 LI Qin;WU Qiongyao;WU Mingjuan;LIN Longjun;DUAN Dachuan;LIN Xuemei(The 44th Research Institute of CETC,Chongqing 400060,China)

机构地区：[1]中国电子科技集团公司第四十四研究所,重庆400060

出　　处：《电子产品可靠性与环境试验》2022年第2期36-39,共4页Electronic Product Reliability and Environmental Testing

摘　　要：微光成像技术在国防军事、科学研究等多方面有着不可替代的作用,已经成为各国竞相发展的战略高新技术。目前,空间用EMCCD芯片的设计与制造均由美国公司完全掌握,但美国政府对EMCCD技术进行严格的技术封锁和产品出口管制。而我国全天时相机对地观察等系统需要采用EMCCD,因此,急需针对国产化EMCCD开展倍增增益老化分析与评价。主要针对EMCCD的衰减特性,制定了3种不同的老化测试方法。通过对器件衰减曲线数据进行记录和分析,得出了器件在同一工作温度、不同和起始倍增倍数下,以及调节和不调节倍增电压情况下的衰减情况。为EMCCD在生产完成后能够快速地进入增益稳定期提供了一定的数据支撑,同时为其老化测试的方法提供了一定的指导。Low-light imaging technology plays an irreplaceable role in national defense,military,scientific research and other aspects,and has become a strategic high-tech technology developed by various countries.At present,the design and manufacture of space-use EMCCD chips are fully mastered by three US companies,but the US government imposes strict technical blockade and product export control on EMCCD technology.However,systems such as all-day camera-to-ground observation in our country need to use EMCCDs,so it is urgent to carry out multiplication gain burnin analysis and evaluation for localized EMCCDs.According to the attenuation characteristics of EMCCD,three different burn-in test methods are developed.By recording and analyzing the device attenuation curve data,the device attenuation under different initial multiplication times and with or without the adjustment of multiplication voltage is obtained at the same temperature,which provides certain data support for EMCCD to quickly enter the gain stabilization period after production is completed,and also provides certain guidance for its burn-in test.

关 键 词：电子倍增电荷耦合器件 微光成像 倍增增益老化 国产化 

分 类 号：TB114.37[理学—概率论与数理统计]