热老化对空心电抗器匝间绝缘材料性能影响  

Influence of Thermal Aging on Properties of Turn-to-Turn Insulation Material of Dry Type Air Core Reactor

作　　者：孙勇[1] 陈晓鹏[1] Sun Yong;Chen Xiaopeng(China Southern Power Grid Ultrahigh Voltage Transmission Company Maintenance Test Center,Guangzhou,Guangdong,510663)

机构地区：[1]中国南方电网超高压输电公司检修实验中心,广东广州510663

出　　处：《现代塑料加工应用》2022年第2期24-26,30,共4页Modern Plastics Processing and Applications

摘　　要：在280,300,320℃下对包绕电磁线的聚酰亚胺薄膜分别进行热老化试验,研究了热老化对聚酰亚胺薄膜力学性能、微观结构、热学及电学性能的影响。结果表明:热老化使聚酰亚胺薄膜结构遭到破坏,其拉伸强度显著下降,且热老化温度越高,拉伸强度下降幅度越大;计算得到热老化前后聚酰亚胺薄膜的反应活化能分别为151.88kJ/mol和139.92kJ/mol;热老化后,聚酰亚胺薄膜包绕电磁线的绝缘击穿电压下降。Thermal aging experiments were carried out on the polyimide film wrapped around the magnet wire at 280,300,320℃,respectively.The effects of thermal aging on the mechanical properties,microstructure,thermal and electrical properties of polyimide films were studied.The results show that the structure of polyimide film has been destroyed by thermal aging,and its tensile strength decreases significantly.The higher the thermal aging temperature,the greater the decrease of tensile strength.The calculated activation energy of polyimide film before and after thermal aging is 151.88kJ/mol and 139.92kJ/mol respectively.After thermal aging,the insulation breakdown voltage of electromagnetic wire wrapped by polyimide film decreases.

关 键 词：聚酰亚胺薄膜 热老化 活化能 微观组织 绝缘击穿电压 

分 类 号：TM47[电气工程—电器]