退火工艺对纯钨电阻点焊电极显微组织性能及使用寿命的影响  

Effect of Annealing Process on Microstructure,Properties and Service Life of Pure Tungsten Resistance Spot Welding Electrode

作　　者：钟昌炽 Zhong Changchi(Ganzhou Hongfei Tungsten Molybdenum Material Co.,Ltd.,Ganzhou Jiangxi 341008)

机构地区：[1]赣州虹飞钨钼材料有限公司,江西赣州341008

出　　处：《山西冶金》2021年第6期81-82,共2页Shanxi Metallurgy

摘　　要：通过对纯钨电阻点焊电极进行点焊测试及对其显微组织进行对比分析,研究不同高频退火工艺对其显微组织性能及使用寿命的影响。结果表明,通过高频退火工艺合理控制电极材料晶粒度及其显微组织形貌,能够有效延缓焊接面微裂纹的产生,进而延长材料的使用寿命。Through spot welding test of pure tungsten resistance spot welding electrode and comparative analysis of microstructure,the effects of different high-frequency annealing processes on the microstructure,properties and service life of it were studied.The results show that the generation of microcracks on the welding surface can be effectively delayed and the service life of the material can be prolonged by reasonably controlling the grain size and microstructure of the electrode material by high frequency annealing process.

关 键 词：退火 纯钨 电阻点焊电极 显微组织 使用寿命 

分 类 号：TG156.2[金属学及工艺—热处理]