背景纹影测量技术研究与应用进展  

Recent advances in background oriented Schlieren and its applications

作　　者：熊渊 XIONG Yuan(Key Laboratory of Fluid Mechanics of Ministry of Education,Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学流体力学教育部重点实验室,北京100191

出　　处：《实验流体力学》2022年第2期30-48,共19页Journal of Experiments in Fluid Mechanics

基　　金：国家自然科学青年基金(12102028);国家自然科学基金创新群体(11721202)。

摘　　要：背景纹影法是2000年左右新出现的非接触式光学测量技术,可用于变密度流动的可视化和相关折射率场的定量测量。与经典的刀片式(Knife-edge)、彩虹式(Rainbow)纹影测量技术比较,BOS具有硬件搭建简单、标定方便、测量视窗不受光学元器件尺寸限制等显著优点。通过详细介绍BOS方法的基本原理与核心性能指标,并依据搭建BOS流动测量系统的思路,回顾了近年来国内外BOS技术的发展情况,最后介绍了BOS技术在超声速流动、燃烧、等离子体等复杂流动领域的应用。Background oriented Schlieren(BOS)has appeared near 2000 as a variant of the classical schlieren technique.It is a new non-intrusive optical diagnostic technique for measuring the refractive index of complex flows quantitatively.Compared to knife-edge and rainbow Schlieren,BOS is advantageous in terms of optical alignment,systematic calibration,and the dimension of the field of view.The principle and the essential system parameters of BOS are introduced in detail.An overview of recent advances in the BOS technology is presented according to the typical sequence of setting up a BOS system.Finally,recent applications of BOS in super/hypersonic flows,combustion,and plasma flow environments are also introduced.

关 键 词：背景纹影 层析重构 超音速流动 燃烧 等离子体 

分 类 号：O355[理学—流体力学]