太赫兹量子器件光电测试技术与系统  

Photoelectric measurement based on terahertz quantum devices and systems

作　　者：谭智勇[1,2] 曹俊诚 TAN Zhi-Yong;CAO Jun-Cheng(Laboratory of Terahertz Solid-State Technology,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China;Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院上海微系统与信息技术研究所,太赫兹固态技术实验室,上海200050 [2]中国科学院大学材料与光电研究中心,北京100049

出　　处：《物理》2022年第5期328-336,共9页Physics

基　　金：国家自然科学基金(批准号:61927813,62035014);上海市“科技创新行动计划”(批准号:21DZ1101102)资助项目。

摘　　要：光电测试技术是太赫兹辐射研究的重要基础技术。文章首先介绍两种太赫兹量子器件的工作原理和最新进展,随后主要介绍太赫兹量子器件在脉冲激光功率测量技术、快速调制与直接探测技术、激光偏振转换与测量以及光纤损耗测量技术及相关测试系统中的应用。最后总结基于太赫兹量子器件的光电测试技术的特点和优势,并对未来的发展进行展望。Photoelectric measurement is an important basic technology in studies of terahertz radiation.This paper first describes the principle of operation of two terahertz quantum devices and their latest development,followed by an introduction to their applications in pulsed light power measurement,fast modulation and direct detection of terahertz light,optical polarization conversion and measurement,terahertz fiber loss measurement,and related test systems.Finally,the characteristics and advantages of photoelectric measurement techniques based on terahertz quantum well devices are summarized,and future developments assessed.

关 键 词：太赫兹辐射 光电测试技术 量子级联激光器 量子阱探测器 

分 类 号：O441.4[理学—电磁学] TN206[理学—物理]